79th ARFTG Microwave Measurement Conference
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9781467312318, 9781467312295, 9781467312301
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Broadband lumped package modeling for scaling multi-cell GaN HEMT power devices

2012 ◽  
Author(s):  
Subrata Halder ◽  
Faramarz Kharabi ◽  
Tim Howle ◽  
John McMacken ◽  
Christopher Burns ◽  
...  
Keyword(s):  
Power Devices ◽  
Gan Hemt

scholarly journals Establishing traceability of an electronic calibration unit using the NIST Microwave Uncertainty Framework

2012 ◽  
Author(s):  
Jeffrey A. Jargon ◽  
Dylan F. Williams ◽  
T. Mitch Wallis ◽  
Denis X. LeGolvan ◽  
Paul D. Hale
Keyword(s):  
Calibration Unit

VNA Tools II: S-parameter uncertainty calculation

2012 ◽  
Author(s):  
Michael Wollensack ◽  
Johannes Hoffmann ◽  
Juerg Ruefenacht ◽  
Markus Zeier
Keyword(s):  
Parameter Uncertainty ◽  
S Parameter ◽  
Uncertainty Calculation
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