A new baseband measurement system for characterization of memory effects in nonlinear microwave devices

2012 ◽  
Author(s):  
Mattias Thorsell ◽  
Kristoffer Andersson
Keyword(s):  
Measurement System ◽  
Memory Effects ◽  
Microwave Devices

Broadband Time-Domain Measurement System for the Characterization of Nonlinear Microwave Devices With Memory

2010 ◽  
Vol 58 (4) ◽  
pp. 1038-1045 ◽  
Author(s):  
Mouhamad Abouchahine ◽  
Alaa Saleh ◽  
Guillaume Neveux ◽  
Tibault Reveyrand ◽  
Jean-Pierre Teyssier ◽  
...  
Keyword(s):  
Measurement System ◽  
Time Domain ◽  
Microwave Devices ◽  
With Memory

80ns/45GHz Pulsed measurement system for DC and RF characterization of high speed microwave devices

2013 ◽  
Vol 84 ◽  
pp. 74-82 ◽  
Author(s):  
Mario Weiß ◽  
Sébastien Fregonese ◽  
Marco Santorelli ◽  
Amit Kumar Sahoo ◽  
Cristell Maneux ◽  
...  
Keyword(s):  
Measurement System ◽  
High Speed ◽  
Microwave Devices

Characterization of baseband electrical memory in microwave devices using multi-tone measurement system

2016 ◽  
Author(s):  
Muhammad Akmal Chaudhary ◽  
Zulifqar Ali Memon ◽  
Zubaida Yusoff ◽  
Jonathon Lees ◽  
Johannes Benedikt ◽  
...  
Keyword(s):  
Measurement System ◽  
Microwave Devices
Sign in / Sign up

Export Citation Format

Share Document