Focused Ion Beam Systems
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Published By Cambridge University Press

9780511600302
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Gas assisted ion beam etching and deposition

2010 ◽  
pp. 67-86 ◽  
Author(s):  
Hyoung Ho (Chris) Kang ◽  
Clive Chandler ◽  
Matthew Weschler
Keyword(s):  
Ion Beam ◽  
Ion Beam Etching

In-situ sample manipulation and imaging

2010 ◽  
pp. 250-267 ◽  
Author(s):  
T. Kamino ◽  
T. Yaguchi ◽  
T. Ohnishi ◽  
T. Ishitani

Imaging using electrons and ion beams

2010 ◽  
pp. 87-125 ◽  
Author(s):  
Kaoru Ohya ◽  
Tohru Ishitani
Keyword(s):  
Ion Beams

Focused ion beam systems as a multifunctional tool for nanotechnology

2010 ◽  
pp. 355-390 ◽  
Author(s):  
Toshiaki Fujii ◽  
Tatsuya Asahata ◽  
Takashi Kaito
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam
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