IEICE Transactions on Electronics
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Published By "Institute Of Electronics, Information And Communications Engineers"

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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor

2022 ◽  
Author(s):  
Fukashi MORISHITA ◽  
Wataru SAITO ◽  
Norihito KATO ◽  
Yoichi IIZUKA ◽  
Masao ITO
Keyword(s):  
Cmos Image Sensor ◽  
Image Sensor ◽  
Pattern Generator ◽  
High Accuracy ◽  
Ramp Test ◽  
Accuracy Test ◽  
Test Circuit ◽  
Fine Pattern

scholarly journals FOREWORD

2021 ◽  
Vol E104.C (12) ◽  
pp. 672-672
Author(s):  
Yoshiki KAYANO

scholarly journals FOREWORD

2021 ◽  
Vol E104.C (10) ◽  
pp. 471-471
Author(s):  
Takana KAHO

scholarly journals FOREWORD

2021 ◽  
Vol E104.C (10) ◽  
pp. 605-606
Author(s):  
Takashi OSHIMA

scholarly journals FOREWORD

2021 ◽  
Vol E104.C (9) ◽  
pp. 403-404
Author(s):  
Satoshi KOHJIRO

scholarly journals FOREWORD

2021 ◽  
Vol E104.C (7) ◽  
pp. 261-261
Author(s):  
Makoto NAGATA

scholarly journals FOREWORD

2021 ◽  
Vol E104.C (6) ◽  
pp. 168-169
Author(s):  
Tatsuo MORI
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