2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)
Latest Publications

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Published By IEEE

9781538650691, 9781538650714

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Session 7: Test parallelism

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2018.8383782 ◽

2018 ◽

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Test structures for evaluating Al2O3 dielectrics for graphene field effect transistors on flexible substrates

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2018.8383768 ◽

2018 ◽

Author(s):

Xinxin Yang ◽

Marlene Bonmann ◽

Andrei Vorobiev ◽

Kjell Jeppson ◽

Jan Stake

Keyword(s):

Field Effect ◽

Field Effect Transistors ◽

Flexible Substrates

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Algorithm based adaptive parametric testing for outlier detection and test time reduction

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2018.8383784 ◽

2018 ◽

Cited By ~ 3

Author(s):

Veenadhar Katragadda ◽

Martin Muthee ◽

Arthur Gasasira ◽

Frank Seelmann ◽

Jiun-Hsin Liao

Keyword(s):

Outlier Detection ◽

Test Time ◽

Test Time Reduction ◽

Parametric Testing ◽

Time Reduction

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DFT-enabled within-die AC uniformity and performance monitor structure for advanced process

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2018.8383778 ◽

2018 ◽

Author(s):

Nui Chong ◽

I-Ru Chen ◽

Da Cheng ◽

Amitava Majumdar ◽

Ping-Chin Yeh ◽

...

Keyword(s):

Performance Monitor ◽

And Performance

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Measurement time reduction technique for input referred noise of dynamic comparator

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2018.8383799 ◽

2018 ◽

Author(s):

Yuki Ishijima ◽

Shuya Nakagawa ◽

Hiroki Ishikuro

Keyword(s):

Reduction Technique ◽

Measurement Time ◽

Dynamic Comparator ◽

Time Reduction

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2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2018.8383746 ◽

2018 ◽

Keyword(s):

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Wafer level characterisation of microelectrodes for electrochemical sensing applications

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2018.8383793 ◽

2018 ◽

Author(s):

E. O. Blair ◽

L. Parga Basanta ◽

I. Schmueser ◽

J. R. K. Marland ◽

A. Buchoux ◽

...

Keyword(s):

Electrochemical Sensing ◽

Wafer Level ◽

Sensing Applications

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Measurement of temperature effect on random telegraph noise induced delay fluctuation

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2018.8383801 ◽

2018 ◽

Cited By ~ 1

Author(s):

A.K.M. Mahfuzul Islam ◽

Masashi Oka ◽

Hidetoshi Onodera

Keyword(s):

Temperature Effect ◽

Random Telegraph Noise ◽

Telegraph Noise

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Sensitivity of high-k encapsulated MoS2 transistors to I-V measurement execution time

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2018.8383789 ◽

2018 ◽

Author(s):

Pavel Bolshakov ◽

Ava Khosravi ◽

Peng Zhao ◽

Robert M. Wallace ◽

Chadwin D. Young ◽

...

Keyword(s):

Execution Time ◽

High K

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Versatile chip-level integrated test vehicle for dynamic thermal evaluation

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2018.8383779 ◽

2018 ◽

Author(s):

Suresh Parameswaran ◽

Saravanan Balakrishnan ◽

Boon Ang

Keyword(s):

Test Vehicle

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2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Session 7: Test parallelism

Test structures for evaluating Al2O3 dielectrics for graphene field effect transistors on flexible substrates

Algorithm based adaptive parametric testing for outlier detection and test time reduction

DFT-enabled within-die AC uniformity and performance monitor structure for advanced process

Measurement time reduction technique for input referred noise of dynamic comparator

[Copyright notice]

Wafer level characterisation of microelectrodes for electrochemical sensing applications

Measurement of temperature effect on random telegraph noise induced delay fluctuation

Sensitivity of high-k encapsulated MoS2 transistors to I-V measurement execution time

Versatile chip-level integrated test vehicle for dynamic thermal evaluation

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)
Latest Publications