ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)
Latest Publications
TOTAL DOCUMENTS
41
(FIVE YEARS 0)
H-INDEX
5
(FIVE YEARS 0)
Published By IEEE
0780356497
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Wafer level reliability (WLR) special interest group (SIG)
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)
◽
10.1109/irws.1999.830586
◽
2005
◽
Author(s):
A. Martin
Keyword(s):
Interest Group
◽
Special Interest
◽
Special Interest Group
◽
Wafer Level
Download Full-text
Burn-in
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)
◽
10.1109/irws.1999.830574
◽
2005
◽
Author(s):
R. Vollertsen
◽
R. Hijab
Download Full-text
Thin oxide limits
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)
◽
10.1109/irws.1999.830575
◽
2005
◽
Author(s):
E. Vincent
◽
J.S. Suehle
Keyword(s):
Thin Oxide
Download Full-text
Hot-carriers
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)
◽
10.1109/irws.1999.830577
◽
2005
◽
Cited By ~ 1
Author(s):
A. Bravaix
Keyword(s):
Hot Carriers
Download Full-text
Electromigration
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)
◽
10.1109/irws.1999.830576
◽
2005
◽
Cited By ~ 1
Author(s):
T. Sullivan
◽
H. Schafft
Download Full-text
WLR discussion group summary
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)
◽
10.1109/irws.1999.830573
◽
2005
◽
Author(s):
C. Graas
◽
E. Achee
Keyword(s):
Discussion Group
Download Full-text
Signal margin test to identify process sensitivities relevant to DRAM reliability and functionality at low temperatures
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)
◽
10.1109/irws.1999.830551
◽
2003
◽
Cited By ~ 2
Author(s):
E. Nelson
◽
Y. Li
◽
D. Poindexter
◽
M. Ruprecht
◽
E. Lim
◽
...
Keyword(s):
Low Temperatures
Download Full-text
Predicting thermal behavior of interconnects
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)
◽
10.1109/irws.1999.830558
◽
2003
◽
Cited By ~ 11
Author(s):
J. Gill
◽
D. Harmon
◽
J. Furukawa
◽
T. Sullivan
Keyword(s):
Thermal Behavior
Download Full-text
Reliability test results for W FIB interconnect structures
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)
◽
10.1109/irws.1999.830553
◽
2003
◽
Author(s):
M. Zaragoza
◽
Jingwei Zhang
◽
M. Abramo
Keyword(s):
Reliability Test
◽
Test Results
Download Full-text
A new technique for the precise measurement of gate oxide damage caused by process induced charging
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)
◽
10.1109/irws.1999.830582
◽
2003
◽
Author(s):
T.E. Turner
◽
A. Pronin
◽
J. Daniels
Keyword(s):
Precise Measurement
◽
Gate Oxide
◽
New Technique
◽
A New Technique
◽
Oxide Damage
Download Full-text
Load More ...
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close