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European Test Workshop 1999 (Cat. No.PR00390)
Latest Publications
TOTAL DOCUMENTS
27
(FIVE YEARS 0)
H-INDEX
7
(FIVE YEARS 0)
Published By IEEE Comput. Soc
076950390x
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Latest Documents
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Extending fault-based testing to microelectromechanical systems
European Test Workshop 1999 (Cat. No.PR00390)
◽
10.1109/etw.1999.804234
◽
2003
◽
Cited By ~ 2
Author(s):
S. Mir
◽
B. Charlot
◽
B. Courtois
Keyword(s):
Microelectromechanical Systems
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Test configuration minimization for the logic cells of SRAM-based FPGAs: a case study
European Test Workshop 1999 (Cat. No.PR00390)
◽
10.1109/etw.1999.804520
◽
2003
◽
Cited By ~ 4
Author(s):
M. Renovell
◽
J.M. Portal
◽
J. Figueras
◽
Y. Zorian
Keyword(s):
Test Configuration
◽
Logic Cells
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Application of supply current testing to analogue circuits, towards a structural analogue test methodology
European Test Workshop 1999 (Cat. No.PR00390)
◽
10.1109/etw.1999.804221
◽
2003
◽
Cited By ~ 7
Author(s):
H. Manhaeve
◽
J. Verfaillie
◽
B. Straka
◽
J.P. Cornil
Keyword(s):
Structural Analogue
◽
Current Testing
◽
Test Methodology
◽
Analogue Circuits
◽
Supply Current
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Functional and structural testing of switched-current circuits
European Test Workshop 1999 (Cat. No.PR00390)
◽
10.1109/etw.1999.803821
◽
2003
◽
Cited By ~ 5
Author(s):
M. Renovell
◽
F. Azais
◽
J.-C. Bodin
◽
Y. Bertrand
Keyword(s):
Structural Testing
◽
Switched Current
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Design of an automatic testing for FPGAs
European Test Workshop 1999 (Cat. No.PR00390)
◽
10.1109/etw.1999.804522
◽
2003
◽
Cited By ~ 9
Author(s):
A. Doumar
◽
T. Ohmameuda
◽
H. Ito
Keyword(s):
Automatic Testing
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On maximizing the coverage of catastrophic and parametric faults
European Test Workshop 1999 (Cat. No.PR00390)
◽
10.1109/etw.1999.804430
◽
2003
◽
Cited By ~ 3
Author(s):
A.M. Brosa
◽
J. Figueras
Keyword(s):
Parametric Faults
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The role of test protocols in testing embedded-core-based system ICs
European Test Workshop 1999 (Cat. No.PR00390)
◽
10.1109/etw.1999.804248
◽
2003
◽
Cited By ~ 18
Author(s):
E.J. Marinissen
◽
M. Lousberg
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A new approach for the nonlinearity test of ADCs/DACs and its application for BIST
European Test Workshop 1999 (Cat. No.PR00390)
◽
10.1109/etw.1999.804206
◽
2003
◽
Author(s):
Fang Xu
Keyword(s):
New Approach
◽
Nonlinearity Test
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On calculating efficient LFSR seeds for built-in self test
European Test Workshop 1999 (Cat. No.PR00390)
◽
10.1109/etw.1999.803819
◽
2003
◽
Cited By ~ 26
Author(s):
C. Fagot
◽
O. Gascuel
◽
P. Girard
◽
C. Landrault
Keyword(s):
Self Test
◽
Built In Self Test
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On random pattern testability of cryptographic VLSI cores
European Test Workshop 1999 (Cat. No.PR00390)
◽
10.1109/etw.1999.803820
◽
2003
◽
Cited By ~ 4
Author(s):
A. Schubert
◽
W. Anheier
Keyword(s):
Random Pattern
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