Physics of Thin Films - Optical Characterization of Real Surfaces and Films
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By Elsevier

9780125330190

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Copyright page

Physics of Thin Films - Optical Characterization of Real Surfaces and Films ◽

10.1016/b978-0-12-533019-0.50003-x ◽

1994 ◽

pp. iv

Serial Editors

Physics of Thin Films - Optical Characterization of Real Surfaces and Films ◽

10.1016/b978-0-12-533019-0.50001-6 ◽

1994 ◽

pp. ii

Characterization of Ferroelectric Films by Spectroscopic Ellipsometry

Physics of Thin Films - Optical Characterization of Real Surfaces and Films ◽

10.1016/b978-0-12-533019-0.50010-7 ◽

1994 ◽

pp. 249-278 ◽

Cited By ~ 2

Author(s):

S. TROLIER-MCKINSTRY ◽

P. CHINDAUDOM ◽

K. VEDAM ◽

R.E. NEWNHAM

Keyword(s):

Spectroscopic Ellipsometry ◽

Ferroelectric Films

Author Index

Physics of Thin Films - Optical Characterization of Real Surfaces and Films ◽

10.1016/b978-0-12-533019-0.50012-0 ◽

1994 ◽

pp. 315-321

Effects of Optical Anisotropy on Spectro-ellipsometric Data for Thin Films and Surfaces

Physics of Thin Films - Optical Characterization of Real Surfaces and Films ◽

10.1016/b978-0-12-533019-0.50011-9 ◽

1994 ◽

pp. 279-314 ◽

Cited By ~ 1

Author(s):

ATUL N. PARIKH ◽

DAVID L. ALLARA

Keyword(s):

Thin Films ◽

Optical Anisotropy

Real-Time Spectroscopic Ellipsometry Studies of the Nucleation, Growth, and Optical Functions of Thin Films, Part I: Tetrahedrally Bonded Materials

Physics of Thin Films - Optical Characterization of Real Surfaces and Films ◽

10.1016/b978-0-12-533019-0.50007-7 ◽

1994 ◽

pp. 49-125 ◽

Cited By ~ 14

Author(s):

ROBERT W. COLLINS ◽

ILSIN AN ◽

HIEN V. NGUYEN ◽

YOUMING LI ◽

YIWEI LU

Keyword(s):

Thin Films ◽

Real Time ◽

Spectroscopic Ellipsometry ◽

Bonded Materials ◽

Optical Functions ◽

Nucleation Growth ◽

Tetrahedrally Bonded

Preface

Physics of Thin Films - Optical Characterization of Real Surfaces and Films ◽

10.1016/b978-0-12-533019-0.50005-3 ◽

1994 ◽

pp. xi-xv

Front Matter

Physics of Thin Films - Optical Characterization of Real Surfaces and Films ◽

10.1016/b978-0-12-533019-0.50002-8 ◽

1994 ◽

pp. iii

Optical Characterization of Inhomogeneous Transparent Films on Transparent Substrates by Spectroscopic Ellipsometry

Physics of Thin Films - Optical Characterization of Real Surfaces and Films ◽

10.1016/b978-0-12-533019-0.50009-0 ◽

1994 ◽

pp. 191-247 ◽

Cited By ~ 15

Author(s):

P. CHINDAUDOM ◽

K. VEDAM

Keyword(s):

Spectroscopic Ellipsometry ◽

Optical Characterization ◽

Transparent Films

Subject Index

Physics of Thin Films - Optical Characterization of Real Surfaces and Films ◽

10.1016/b978-0-12-533019-0.50013-2 ◽

1994 ◽

pp. 323-328

Physics of Thin Films - Optical Characterization of Real Surfaces and FilmsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Elsevier

Copyright page

Serial Editors

Characterization of Ferroelectric Films by Spectroscopic Ellipsometry

Author Index

Effects of Optical Anisotropy on Spectro-ellipsometric Data for Thin Films and Surfaces

Real-Time Spectroscopic Ellipsometry Studies of the Nucleation, Growth, and Optical Functions of Thin Films, Part I: Tetrahedrally Bonded Materials

Preface

Front Matter

Optical Characterization of Inhomogeneous Transparent Films on Transparent Substrates by Spectroscopic Ellipsometry

Subject Index

Physics of Thin Films - Optical Characterization of Real Surfaces and Films
Latest Publications