Proceedings 13th IEEE VLSI Test Symposium
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71

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Published By IEEE Comput. Soc. Press

0818670002

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Detectable perturbations: a paradigm for technology-specific multi-fault test generation

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512660 ◽

2002 ◽

Author(s):

A. Zemva ◽

F. Brglez

Keyword(s):

Test Generation

Compact test generation for bridging faults under I/sub DDQ/ testing

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512654 ◽

2002 ◽

Cited By ~ 17

Author(s):

R.S. Reddy ◽

I. Pomeranz ◽

S.M. Reddy ◽

S. Kajihara

Keyword(s):

Test Generation ◽

Bridging Faults ◽

Compact Test

High level fault modeling of asynchronous circuits

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512636 ◽

2002 ◽

Author(s):

Ding Lu ◽

C.Q. Tong

Keyword(s):

Asynchronous Circuits ◽

Fault Modeling ◽

High Level

Generation of high quality tests for functional sensitizable paths

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512663 ◽

2002 ◽

Cited By ~ 11

Author(s):

A. Krstic ◽

Kwang-Ting Cheng

Keyword(s):

High Quality

Verification of transient response of linear analog circuits

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512615 ◽

2002 ◽

Cited By ~ 12

Author(s):

A. Balivada ◽

Y. Hoskote ◽

J.A. Abraham

Keyword(s):

Transient Response ◽

Analog Circuits ◽

Linear Analog

Compact test sets for industrial circuits

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512661 ◽

2002 ◽

Cited By ~ 10

Author(s):

M.H. Konijnenburg ◽

J.T. van der Linden ◽

A.J. van de Goor

Keyword(s):

Test Sets ◽

Industrial Circuits ◽

Compact Test

Resynthesis for sequential circuits designed with a specified initial state

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512630 ◽

2002 ◽

Cited By ~ 1

Author(s):

H. Yotsuyanagi ◽

S. Kajihara ◽

K. Kinoshita

Keyword(s):

Sequential Circuits ◽

Initial State

On shrinking wide compressors

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512625 ◽

2002 ◽

Cited By ~ 1

Author(s):

J. Savir

Testability of floating gate defects in sequential circuits

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512638 ◽

2002 ◽

Cited By ~ 14

Author(s):

V.H. Champac ◽

J. Figueras

Keyword(s):

Sequential Circuits ◽

Floating Gate

Diagnosis of scan path failures

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512645 ◽

2002 ◽

Cited By ~ 74

Author(s):

S. Edirisooriya ◽

G. Edirisooriya

Keyword(s):

Scan Path