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Proceedings 13th IEEE VLSI Test Symposium
Latest Publications
TOTAL DOCUMENTS
71
(FIVE YEARS 0)
H-INDEX
17
(FIVE YEARS 0)
Published By IEEE Comput. Soc. Press
0818670002
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Latest Documents
Most Cited Documents
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Generation of high quality tests for functional sensitizable paths
Proceedings 13th IEEE VLSI Test Symposium
◽
10.1109/vtest.1995.512663
◽
2002
◽
Cited By ~ 11
Author(s):
A. Krstic
◽
Kwang-Ting Cheng
Keyword(s):
High Quality
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Detectable perturbations: a paradigm for technology-specific multi-fault test generation
Proceedings 13th IEEE VLSI Test Symposium
◽
10.1109/vtest.1995.512660
◽
2002
◽
Author(s):
A. Zemva
◽
F. Brglez
Keyword(s):
Test Generation
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Compact test generation for bridging faults under I/sub DDQ/ testing
Proceedings 13th IEEE VLSI Test Symposium
◽
10.1109/vtest.1995.512654
◽
2002
◽
Cited By ~ 17
Author(s):
R.S. Reddy
◽
I. Pomeranz
◽
S.M. Reddy
◽
S. Kajihara
Keyword(s):
Test Generation
◽
Bridging Faults
◽
Compact Test
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High level fault modeling of asynchronous circuits
Proceedings 13th IEEE VLSI Test Symposium
◽
10.1109/vtest.1995.512636
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2002
◽
Author(s):
Ding Lu
◽
C.Q. Tong
Keyword(s):
Asynchronous Circuits
◽
Fault Modeling
◽
High Level
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Compact test sets for industrial circuits
Proceedings 13th IEEE VLSI Test Symposium
◽
10.1109/vtest.1995.512661
◽
2002
◽
Cited By ~ 10
Author(s):
M.H. Konijnenburg
◽
J.T. van der Linden
◽
A.J. van de Goor
Keyword(s):
Test Sets
◽
Industrial Circuits
◽
Compact Test
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Verification of transient response of linear analog circuits
Proceedings 13th IEEE VLSI Test Symposium
◽
10.1109/vtest.1995.512615
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2002
◽
Cited By ~ 12
Author(s):
A. Balivada
◽
Y. Hoskote
◽
J.A. Abraham
Keyword(s):
Transient Response
◽
Analog Circuits
◽
Linear Analog
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Resynthesis for sequential circuits designed with a specified initial state
Proceedings 13th IEEE VLSI Test Symposium
◽
10.1109/vtest.1995.512630
◽
2002
◽
Cited By ~ 1
Author(s):
H. Yotsuyanagi
◽
S. Kajihara
◽
K. Kinoshita
Keyword(s):
Sequential Circuits
◽
Initial State
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On shrinking wide compressors
Proceedings 13th IEEE VLSI Test Symposium
◽
10.1109/vtest.1995.512625
◽
2002
◽
Cited By ~ 1
Author(s):
J. Savir
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Testability of floating gate defects in sequential circuits
Proceedings 13th IEEE VLSI Test Symposium
◽
10.1109/vtest.1995.512638
◽
2002
◽
Cited By ~ 14
Author(s):
V.H. Champac
◽
J. Figueras
Keyword(s):
Sequential Circuits
◽
Floating Gate
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Diagnosis of scan path failures
Proceedings 13th IEEE VLSI Test Symposium
◽
10.1109/vtest.1995.512645
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2002
◽
Cited By ~ 74
Author(s):
S. Edirisooriya
◽
G. Edirisooriya
Keyword(s):
Scan Path
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