Accelerated life testing or partially accelerated life tests is very important in life testing experiments because it saves time and cost. Partially accelerated life tests are used when the data obtained from accelerated life tests cannot be extrapolated to usual conditions. This paper proposes, constant–stress partially accelerated life test using Type II censored samples, assuming that the lifetime of items under usual condition have the Topp Leone-inverted Kumaraswamy distribution. The Bayes estimators for the parameters, acceleration factor, reliability and hazard rate function are obtained. Bayes estimators based on informative priors is derived under the balanced square error loss function as a symmetric loss function and balanced linear exponential loss function as an asymmetric loss function. Also, Bayesian prediction (point and bounds) is considered for a future observation based on Type-II censored under two samples prediction. Numerical studies are given and some interesting comparisons are presented to illustrate the theoretical results. Moreover, the results are applied to real data sets.
Optimal designs of constant‐stress accelerated life‐tests for one‐shot devices with model misspecification analysis
