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Summary of ISO/TC 201 standard: ISO 19668-Surface chemical analysis-X-ray photoelectron spectroscopy-Estimating and reporting detection limits for elements in homogeneous materials
Surface and Interface Analysis
◽
10.1002/sia.6339
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2017
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Vol 50
(1)
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pp. 87-89
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Cited By ~ 3
Author(s):
A. G. Shard
◽
C. A. Clifford
Keyword(s):
Chemical Analysis
◽
Photoelectron Spectroscopy
◽
Detection Limits
◽
Surface Chemical
◽
X Ray
◽
Homogeneous Materials
◽
Surface Chemical Analysis
Download Full-text
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Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
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◽
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◽
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◽
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Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
10.3403/30333433
◽
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◽
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◽
Surface Chemical
◽
X Ray
◽
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◽
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Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
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◽
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◽
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◽
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Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
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◽
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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
10.3403/30124424
◽
2005
◽
Keyword(s):
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◽
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Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
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◽
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◽
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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
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Auger Electron Spectroscopy
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Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
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◽
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Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006—Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—methods used to determine peak intensities and information required when reporting results
Surface and Interface Analysis
◽
10.1002/sia.2533
◽
2007
◽
Vol 39
(5)
◽
pp. 464-466
◽
Cited By ~ 7
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◽
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◽
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◽
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◽
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◽
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◽
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Summary of ISO/TC201 technical report: ISO/TR 18392: 2005—Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds
Surface and Interface Analysis
◽
10.1002/sia.2365
◽
2006
◽
Vol 38
(7)
◽
pp. 1173-1175
◽
Cited By ~ 8
Author(s):
L. Kövér
Keyword(s):
Chemical Analysis
◽
Photoelectron Spectroscopy
◽
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◽
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◽
Technical Report
◽
Surface Chemical Analysis
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