A Practical Multi-Echelon Inventory Model with Semiconductor Manufacturing Application

Author(s):  
Kaan Katircioglu ◽  
Guillermo Gallego
1996 ◽  
Vol 47 (9) ◽  
pp. 1192-1200 ◽  
Author(s):  
Rhonda L Aull-Hyde
Keyword(s):  

2015 ◽  
Vol 4 (1) ◽  
pp. 29-36
Author(s):  
N Mishra ◽  
SP Mishra ◽  
Srichandan Mishra ◽  
J Panda ◽  
UK Misra

Author(s):  
Costas J. Spanos ◽  
Sovarong Leang ◽  
Sherry Lee

2014 ◽  
Vol 12 (9) ◽  
pp. 3921-3926
Author(s):  
Ritha Prakash ◽  
Nivetha Martin

In recent times, we are witnessing the technological revolution which provides access to tremendous changes in all the fields including the industrial sectors. The notable benefit of the modern technology is quick accomplishment of complex tasks within a short span of time, which has motivated the manufacturers to imbibe novelty techniques in the production process to enhance the quality of the product so as to retain its market position amidst the competitors. As globalization has gained more concern, the manufacturers employ internet advertising strategy to elevate the product to international level and to propagate the attributes of the products to the customers residing worldwide. In this paper an EPQ inventory model is developed in which the associated costs of technology, acquisition of local and international customers via internet advertising costs are included, a numerical example is also presented to validate the model.


2018 ◽  
Vol 7 (3) ◽  
pp. 42
Author(s):  
KUMAR ATTRI AMIT ◽  
S. R. SINGH ◽  
CHOUDHARY SHWETA ◽  
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Author(s):  
K. Dhanam ◽  
M. Parimaladevi
Keyword(s):  

Author(s):  
Anqi Qiu ◽  
William Lowe ◽  
Mridul Arora

Abstract Nanoprobing systems have evolved to meet the challenges from recent innovations in the semiconductor manufacturing process. This is demonstrated through an exhibition of standard SRAM measurements on TSMC 7 nm FinFET technology. SEM based nanoprober is shown to meet or exceed the requirements for measuring 7nm technology and beyond. This paper discusses in detail of the best-known methods for nanoprobing on 7nm technology.


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