Study of Thin Films and Multilayers using Energy-Dispersive Diffraction of Synchrotron Radiation

1990 ◽  
pp. 101-107
Author(s):  
R. J. Cernik ◽  
S. M. Clark ◽  
P. Pattison
Keyword(s):  
Thin Films ◽  
Synchrotron Radiation ◽  
Energy Dispersive ◽  
Energy Dispersive Diffraction

Instrumentation for Synchrotron X-Ray Powder Diffractometry

1985 ◽  
Vol 29 ◽  
pp. 243-250 ◽  
Author(s):  
W. Parrish ◽  
M. Hart ◽  
C. G. Erickson ◽  
N. Masciocchi ◽  
T. C. Huang
Keyword(s):  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
Storage Ring ◽  
Scintillation Counter ◽  
Diffraction Method ◽  
Energy Dispersive ◽  
Parallel Beam ◽  
X Ray ◽  
Radiation Laboratory ◽  
Energy Dispersive Diffraction

AbstractThe instrumentation developed for poly crystalline diffractometry using the storage ring at the Stanford Synchrotron Radiation Laboratory is described. A pair of automated vertical scan diffractometers was used for a Si (111) channel monochromator and the powder specimens. The parallel beam powder diffraction was defined by horizontal parallel slits which had several times higher intensity than a receiving slit at the same resolution. The patterns were obtained with 2:1 scanning with’ a selected monochromatic beam, and an energy dispersive diffraction method in which the monochromator is step-scanned, and the specimen and scintillation counter are fixed. Both methods use the same instrumentation.

Study of Thin Films and Multilayers using Energy-Dispersive Diffraction of Synchrotron Radiation

1989 ◽  
Vol 33 ◽  
pp. 101-107 ◽  
Author(s):  
R. J. Cernik ◽  
S. M. Clark ◽  
P. Pattison
Keyword(s):  
Synchrotron Radiation ◽  
Energy Dispersive ◽  
Metallic Films ◽  
Signal To Noise ◽  
Diffraction Geometry ◽  
Glancing Angle ◽  
Preliminary Study ◽  
Rapid Characterization ◽  
Energy Dispersive Diffraction

AbstractWe present the results of a preliminary study of the use of polychromatic synchrotron radiation in energy-dispersive mode for the rapid characterization of thin film and multilayer materials. This technique takes advantage of the high intensity and excellent collimation properties of white beam synchrotron radiation. The glancing angle diffraction geometry allows structural depth probing as well as enhanced signal-to-noise by suppressing substrate contributions. The technique was successfully applied to metallic films a few hundred Angstroms thick, and to W-C multilayers.

High-resolution energy-dispersive diffraction using synchrotron radiation

1978 ◽  
Vol 11 (6) ◽  
pp. 684-687 ◽  
Author(s):  
A. J. Bourdillon ◽  
A. M. Glazer ◽  
M. Hidaka ◽  
J. Bordas
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Energy Dispersive ◽  
Energy Dispersive Diffraction
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