“Nonlocal” Interference Effects in Frequency Domain

Author(s):  
Miloslav Dušek
1992 ◽  
Vol 69 (21) ◽  
pp. 3041-3044 ◽  
Author(s):  
X. Y. Zou ◽  
T. P. Grayson ◽  
L. Mandel

Author(s):  
D. E. Johnson ◽  
S. Csillag

Recently, the applications area of analytical electron microscopy has been extended to include the study of Extended Energy Loss Fine Structure (EXELFS). Modulations past an ionization edge in the energy loss spectrum (EXELFS), contain atomic fine structure information similar to Extended X-ray Absorbtion Fine Structure (EXAFS). At low momentum transfer the main contribution to these modulations comes from interference effects between the outgoing excited inner shell electron waves and electron waves backscattered from the surrounding atoms. The ability to obtain atomic fine structure information (such as interatomic distances) combined with the spatial resolution of an electron microscope is unique and makes EXELFS an important microanalytical technique.


1990 ◽  
Vol 26 (8) ◽  
pp. 1863-1863
Author(s):  
Paul Marschall ◽  
Baldur Barczewski
Keyword(s):  

2012 ◽  
Author(s):  
Emily M. Elliott ◽  
Candice C. Morey ◽  
Richard D. Morey ◽  
Sharon D. Eaves ◽  
Jill T. Shelton ◽  
...  
Keyword(s):  

2013 ◽  
Author(s):  
Dean G. Purcell ◽  
Alan L. Stewart
Keyword(s):  

1975 ◽  
Author(s):  
Richard K. Olson ◽  
Vicki Hanson
Keyword(s):  

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