Non-local $$L_{0}$$ L 0 Gradient Minimization Filter and Its Applications for Depth Image Upsampling

2017 ◽  
pp. 85-96 ◽  
Author(s):  
Hang Yang ◽  
Xueqi Sun ◽  
Ming Zhu ◽  
Kun Wu
Keyword(s):  
Depth Image ◽  
Non Local

A modified non-local mean inpainting technique for occlusion filling in depth-image-based rendering

2011 ◽  
Author(s):  
Lucio Azzari ◽  
Federica Battisti ◽  
Atanas Gotchev ◽  
Marco Carli ◽  
Karen Egiazarian
Keyword(s):  
Depth Image ◽  
Image Based Rendering ◽  
Depth Image Based Rendering ◽  
Local Mean ◽  
Non Local

Depth image super-resolution algorithm based on structural features and non-local means

2018 ◽  
Vol 14 (5) ◽  
pp. 391-395
Author(s):  
Wang Jing ◽  
Wei-Zhong Zhang ◽  
Bao-Xiang Huang ◽  
Huan Yang
Keyword(s):  
Super Resolution ◽  
Structural Features ◽  
Depth Image ◽  
Local Means ◽  
Non Local ◽  
Image Super Resolution ◽  
Resolution Algorithm

A Non-local Low Rank and Total Variation Approach for Depth Image Estimation

2021 ◽  
Author(s):  
Uyen Nguyen ◽  
Truong Giang Tong ◽  
Tat Thang Hoa ◽  
Dai Duong Ha ◽  
Van Ha Tang
Keyword(s):  
Total Variation ◽  
Low Rank ◽  
Depth Image ◽  
Image Estimation ◽  
Variation Approach ◽  
Non Local

Toward High-Resolution Low-Voltage SEM

1988 ◽  
Vol 46 ◽  
pp. 218-219
Author(s):  
Zhifeng Shao
Keyword(s):  
Low Voltage ◽  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Limiting Factor ◽  
Operating Voltage ◽  
Probe Radius ◽  
Non Local ◽  
Electron Microscopes ◽  
Image Position ◽  
Scanning Electron Microscopes

Recently, low voltage (≤5kV) scanning electron microscopes have become popular because of their unprecedented advantages, such as minimized charging effects and smaller specimen damage, etc. Perhaps the most important advantage of LVSEM is that they may be able to provide ultrahigh resolution since the interaction volume decreases when electron energy is reduced. It is obvious that no matter how low the operating voltage is, the resolution is always poorer than the probe radius. To achieve 10Å resolution at 5kV (including non-local effects), we would require a probe radius of 5∽6 Å. At low voltages, we can no longer ignore the effects of chromatic aberration because of the increased ratio δV/V. The 3rd order spherical aberration is another major limiting factor. The optimized aperture should be calculated as

Chromatic aberration and low-voltage SEM

1987 ◽  
Vol 45 ◽  
pp. 546-547
Author(s):  
Zhifeng Shao ◽  
A.V. Crewe
Keyword(s):  
Electron Energy ◽  
Low Voltage ◽  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Primary Electron ◽  
Probe Size ◽  
Non Local ◽  
Optical Treatment ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes

For scanning electron microscopes, it is plausible that by lowering the primary electron energy, one can decrease the volume of interaction and improve resolution. As shown by Crewe /1/, at V0 =5kV a 10Å resolution (including non-local effects) is possible. To achieve this, we would need a probe size about 5Å. However, at low voltages, the chromatic aberration becomes the major concern even for field emission sources. In this case, δV/V = 0.1 V/5kV = 2x10-5. As a rough estimate, it has been shown that /2/ the chromatic aberration δC should be less than ⅓ of δ0 the probe size determined by diffraction and spherical aberration in order to neglect its effect. But this did not take into account the distribution of electron energy. We will show that by using a wave optical treatment, the tolerance on the chromatic aberration is much larger than we expected.

Magic of signs: a non-local interpretation of homeopathy

2000 ◽  
Vol 89 (3) ◽  
pp. 127-140 ◽  
Author(s):  
H Walach
Keyword(s):  
Non Local

Imperfections in non-local elasticity

1998 ◽  
Vol 08 (PR8) ◽  
pp. Pr8-309-Pr8-316 ◽  
Author(s):  
Y. Z. Povstenko
Keyword(s):  
Non Local
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