Universal Test Sets for Reversible Circuits

Lecture Notes in Computer Science - Computing and Combinatorics ◽

10.1007/978-3-642-14031-0_38 ◽

2010 ◽

pp. 348-357 ◽

Author(s):

Satoshi Tayu ◽

Shota Fukuyama ◽

Shuichi Ueno

Keyword(s):

Universal Test ◽

Reversible Circuits ◽

Download Full-text

DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits

Journal of Circuits System and Computers ◽

10.1142/s0218126622501286 ◽

2021 ◽

Author(s):

Joyati Mondal ◽

Dipak Kumar Kole ◽

Hafizur Rahaman ◽

Debesh Kumar Das ◽

Bhargab B. Bhattacharya

Keyword(s):

Test Set ◽

Universal Test ◽

Reversible Circuits

Download Full-text

On Computing Tests for Bridging and Leakage Faults: Complexity Results and Universal Test Sets

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658020 ◽

2005 ◽

Author(s):

S. Chakravarty

Keyword(s):

Universal Test ◽

Complexity Results ◽

Download Full-text

A complement-based fast algorithm to generate universal test sets for combinational function blocks

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224439 ◽

2003 ◽

Author(s):

Beyin Chen ◽

Chung Len Lee

Keyword(s):

Fast Algorithm ◽

Universal Test ◽

Function Blocks ◽

Download Full-text

Universal Test Sets for the Standard Encryption Algorithm

IEEE Transactions on Reliability ◽

10.1109/tr.1982.5221211 ◽

1982 ◽

Vol R-31 (1) ◽

pp. 5-8

Author(s):

Jason Gait

Keyword(s):

Encryption Algorithm ◽

Universal Test ◽

Download Full-text

Universal test sets for logic networks

10.1109/swat.1972.30 ◽

1972 ◽

Author(s):

Sheldon B. Akers

Keyword(s):

Universal Test ◽

Download Full-text

Synthesis of reversible circuits for testing with universal test set and C-testability of reversible iterative logic arrays

18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design ◽

10.1109/icvd.2005.158 ◽

2005 ◽

Author(s):

A. Chakraborty

Keyword(s):

Test Set ◽

Universal Test ◽

Reversible Circuits

Download Full-text

A complement-based fast algorithm to generate universal test sets for multi-output functions

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.265678 ◽

1994 ◽

Vol 13 (3) ◽

pp. 370-377 ◽

Author(s):

Beyin Chen ◽

Chung Len Lee

Keyword(s):

Fast Algorithm ◽

Universal Test ◽

Download Full-text

On generating test sets for reversible circuits

2009 International Conference on Computer Engineering & Systems ◽

10.1109/icces.2009.5383305 ◽

2009 ◽

Author(s):

Kaku Tabei ◽

Toshinori Yamada

Keyword(s):

Reversible Circuits ◽

Download Full-text

On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test Set

21st International Conference on VLSI Design (VLSID 2008) ◽

10.1109/vlsi.2008.106 ◽

2008 ◽

Author(s):

Hafizur Rahaman ◽

Dipak K. Kole ◽

Debesh K. Das ◽

Bhargab B. Bhattacharya

Keyword(s):

Test Set ◽

Universal Test ◽

Reversible Circuits

Download Full-text

Universal Test Sets for Multiple Fault Detection in AND-EXOR Arrays

IEEE Transactions on Computers ◽

10.1109/tc.1978.1675057 ◽

1978 ◽

Vol C-27 (2) ◽

pp. 181-187 ◽

Author(s):

Pradhan

Keyword(s):

Fault Detection ◽

Multiple Fault ◽

Universal Test ◽

Download Full-text