Quantum reversible circuit is a new emerging technology attracting the researchers. A reversible circuit is composed of reversible gates. One example of reversible gate is Toffoli gate. A Toffoli gate (also known as [Formula: see text]-CNOT) has two components — the control and the target. Initially, stuck-at fault and other fault models were used for modeling defects in quantum reversible circuits. Later, a new fault model known as missing gate fault model was introduced, which is more effective in capturing the errors in quantum reversible circuit. Boolean Difference is already a known technique to detect stuck-at faults in conventional CMOS circuit. In this paper, Boolean Difference method is applied to derive the test set for detecting each stuck-at fault and missing gate fault in a reversible circuit. Then an optimization algorithm is used to derive an optimal test set, which will detect all possible faults in a circuit. The method is valid also for other fault models.
A minimal universal test set for self-test of EXOR-Sum-of-Products circuits
