Proceedings First Asian Test Symposium (ATS `92)
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE Comput. Soc. Press

0818629851

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Methods to measure and to enhance the testability of behavioral descriptions of digital circuits

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224448 ◽

2003 ◽

Cited By ~ 1

Author(s):

J.-F. Santucci ◽

G. Dray ◽

M. Boumedine ◽

N. Giambiasi

Keyword(s):

Digital Circuits

Download Full-text

Path delay fault simulation algorithms for sequential circuits

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224444 ◽

2003 ◽

Cited By ~ 13

Author(s):

T.J. Chakraborty ◽

V.D. Agrawal ◽

M.L. Bushnell

Keyword(s):

Fault Simulation ◽

Sequential Circuits ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault ◽

Simulation Algorithms

Download Full-text

Test input vectors for supply current testing of TTL combinational circuits

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224436 ◽

2003 ◽

Cited By ~ 4

Author(s):

M. Hashizume ◽

T. Tamesada ◽

I. Tsukimoto

Keyword(s):

Combinational Circuits ◽

Current Testing ◽

Test Input ◽

Supply Current

Download Full-text

A complement-based fast algorithm to generate universal test sets for combinational function blocks

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224439 ◽

2003 ◽

Cited By ~ 2

Author(s):

Beyin Chen ◽

Chung Len Lee

Keyword(s):

Fast Algorithm ◽

Universal Test ◽

Function Blocks ◽

Test Sets

Download Full-text

Laser injection of spot defects on integrated circuits

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224415 ◽

2003 ◽

Cited By ~ 1

Author(s):

R. Velazco ◽

B. Martinet ◽

G. Auvert

Keyword(s):

Integrated Circuits

Download Full-text

Accelerated fault simulation utilizing multiple-fault propagation

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224432 ◽

2003 ◽

Author(s):

Y. Xing ◽

G. van Brakel ◽

H.G. Kerkhoff

Keyword(s):

Fault Simulation ◽

Fault Propagation ◽

Multiple Fault

Download Full-text

A method of diagnosing logical faults in combinational circuits

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224413 ◽

2003 ◽

Cited By ~ 2

Author(s):

K. Yamazaki ◽

T. Yamada

Keyword(s):

Combinational Circuits

Download Full-text

Test set compaction for combinational circuits

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224429 ◽

2003 ◽

Cited By ~ 35

Author(s):

Jau-Shien Chang ◽

Chen-Shang Lin

Keyword(s):

Combinational Circuits ◽

Test Set ◽

Test Set Compaction

Download Full-text

Design for testability in a 200 MFLOPS vector-pipelined processor (VPP)-ULSI

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224404 ◽

2003 ◽

Cited By ~ 3

Author(s):

Y. Hagihara ◽

C. Ohkubo ◽

F. Okamoto ◽

H. Yamada ◽

M. Takada ◽

...

Keyword(s):

Design For Testability

Download Full-text

Functional tests for arbitration SRAM-type FIFOs

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224443 ◽

2003 ◽

Cited By ~ 13

Author(s):

A.J. van de Goor ◽

Y. Zorian

Keyword(s):

Functional Tests

Download Full-text

Proceedings First Asian Test Symposium (ATS `92)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE Comput. Soc. Press

Methods to measure and to enhance the testability of behavioral descriptions of digital circuits

Path delay fault simulation algorithms for sequential circuits

Test input vectors for supply current testing of TTL combinational circuits

A complement-based fast algorithm to generate universal test sets for combinational function blocks

Laser injection of spot defects on integrated circuits

Accelerated fault simulation utilizing multiple-fault propagation

A method of diagnosing logical faults in combinational circuits

Test set compaction for combinational circuits

Design for testability in a 200 MFLOPS vector-pipelined processor (VPP)-ULSI

Functional tests for arbitration SRAM-type FIFOs

Proceedings First Asian Test Symposium (ATS `92)
Latest Publications