Simulation of Shapiro Steps in Current-Voltage Characteristics of Intrinsic Josephson Junctions in High Temperature Superconductors

2012 ◽  
pp. 221-226
Author(s):  
Mahmoud Gaafar ◽  
Yury Shukrinov ◽  
Hussein El Samman ◽  
Sanaa Maize
Keyword(s):  
High Temperature ◽  
Josephson Junctions ◽  
High Temperature Superconductors ◽  
Shapiro Steps ◽  
Intrinsic Josephson Junctions ◽  
Current Voltage ◽  
Current Voltage Characteristics

EFFECT OF THERMAL NOISE ON THE CURRENT-VOLTAGE CHARACTERISTICS OF JOSEPHSON JUNCTIONS

1996 ◽  
Vol 10 (22) ◽  
pp. 1095-1102 ◽  
Author(s):  
A.K. CHATTAH ◽  
C.B. BRIOZZO ◽  
O. OSENDA ◽  
M.O. CÁCERES
Keyword(s):  
Josephson Junctions ◽  
Thermal Noise ◽  
Planck Equation ◽  
Resonance Problem ◽  
Shapiro Steps ◽  
Periodic Distribution ◽  
Current Voltage ◽  
Current Voltage Characteristics ◽  
Path Integral Method ◽  
Asymptotic Time

We analyze the influence of thermal noise on the Shapiro steps appearing in the current-voltage characteristics of Josephson junctions. We solve the Fokker-Planck equation describing the system by a path integral method in the steepest-descent approximation, previously applied to the stochastic resonance problem. We obtain the Asymptotic Time-Periodic Distribution Pas(ϕ, t), where ϕ∈[0, 2π] and compute from it the voltage [Formula: see text], constructing the I-V characteristics. We find a defined “softening” of the Shapiro steps as temperature increases, for values of the system parameters in the experimentally accessible range.

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