X-ray diffraction study of anisotropy by formation and decomposition of nickel hydride Part I: Orientation dependence of the extent of phase transformation of nickel into nickel hydride

1992 ◽  
Vol 22 (3) ◽  
pp. 262-267 ◽  
Author(s):  
I. Tomov ◽  
M. Monev
2013 ◽  
Vol 97 (4) ◽  
pp. 1256-1263 ◽  
Author(s):  
Zlatomir D. Apostolov ◽  
Pankaj Sarin ◽  
Robert W. Hughes ◽  
Waltraud M. Kriven

2014 ◽  
Vol 582 ◽  
pp. 360-363 ◽  
Author(s):  
Olga Ivanova ◽  
Myroslav Karpets ◽  
Alain R. Yavari ◽  
Konstantinos Georgarakis ◽  
Yuriy Podrezov

2011 ◽  
Vol 116 (1) ◽  
pp. 1401-1407 ◽  
Author(s):  
K. Sakaki ◽  
N. Terashita ◽  
S. Tsunokake ◽  
Y. Nakamura ◽  
E. Akiba

1998 ◽  
Vol 514 ◽  
Author(s):  
T. Nakamura ◽  
K. Ikeda ◽  
H. Tomita ◽  
S. Komiya ◽  
K. Nakajima

ABSTRACTEffects of the C49-TiSi2 epitaxial orientation on the C49-to-C54 phase transformation rate have been studied for samples with different pre-amorphization implantation (PAI) conditions. The C49 epitaxial orientation to the Si(001) substrate is characterized by use of grazing-incidence X-ray diffraction (GIXD) measurements. We found that the PAl treatment suppresses the epitaxial growth of C49-TiSi2 on Si(001) substrates and the poorer orientational alignment of C49-TiSi2 causes a more rapid transformation to C54-TiSi2. We believe this suppression of epitaxial alignment is a possible mechanism to understand the effect of the PAl treatment on the C49-C54 transformation.


2005 ◽  
Vol 176 (25-28) ◽  
pp. 2059-2064 ◽  
Author(s):  
D LISOVYTSKIY ◽  
Z KASZKUR ◽  
J PIELASZEK ◽  
M MARZANTOWICZ ◽  
J DYGAS

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