scholarly journals Nonlinear Microwave Properties of Ferroelectric Thin Films

2004 ◽  
Vol 13 (1-3) ◽  
pp. 223-227 ◽  
Author(s):  
R. W�rdenweber ◽  
R. Ott ◽  
P. Lahl
2005 ◽  
Vol 77 (1) ◽  
pp. 79-85 ◽  
Author(s):  
MIN HWAN KWAK ◽  
YOUNG TAE KIM ◽  
SEUNG EON MOON ◽  
HAN-CHEOL RYU ◽  
SU-JAE LEE ◽  
...  

2003 ◽  
Vol 784 ◽  
Author(s):  
Peter Kr. Petrov

ABSTRACTThis paper examines the problem of evaluating the microwave properties of thin ferroelectric films patterned as planar capacitors. Two types of microwave measurements of ferroelectric thin films are considered: reflection and resonance type measurements. Algorithms are presented for evaluation of capacitance-permittivity and dielectric loss. Using sensitivity analysis, the error and limitations associated with these measurements are estimated. The end result is a series of formulae that use the network analyser's measurement data to calculate the capacitance-permittivity, the dielectric loss, and the associated error.


1998 ◽  
Vol 22 (1-4) ◽  
pp. 317-328 ◽  
Author(s):  
J. M. Pond ◽  
S. W. Kirchoefer ◽  
W. Chang ◽  
J. S. Horwitz ◽  
D. B. Chrisey

2004 ◽  
Vol 84 (21) ◽  
pp. 4147-4149 ◽  
Author(s):  
R. Ott ◽  
P. Lahl ◽  
R. Wördenweber

1998 ◽  
Vol 08 (PR9) ◽  
pp. Pr9-225-Pr9-228
Author(s):  
J. H. Yi ◽  
P. Thomas ◽  
M. Manier ◽  
J. P. Mercurio ◽  
I. Jauberteau ◽  
...  

2001 ◽  
Vol 11 (PR11) ◽  
pp. Pr11-133-Pr11-137
Author(s):  
J. R. Duclère ◽  
M. Guilloux-Viry ◽  
A. Perrin ◽  
A. Dauscher ◽  
S. Weber ◽  
...  

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