A general form of the increments of two-parameter fractional wiener process

2005 ◽  
Vol 20 (3) ◽  
pp. 331-337
Author(s):  
Lu Chuanrong
2001 ◽  
Vol 44 (9) ◽  
pp. 1115-1125 ◽  
Author(s):  
Lixin Zhang ◽  
Chuanrong Lu ◽  
Yaohong Wang

2018 ◽  
Vol 18 (06) ◽  
pp. 1850047 ◽  
Author(s):  
Mariusz Michta ◽  
Kamil Łukasz Świa̧tek

In the paper we study properties of solutions to stochastic differential inclusions and set-valued stochastic differential equations driven by a two-parameter Wiener process. We establish new connections between their solutions. We prove that attainable sets of solutions to such inclusions are subsets of values of multivalued solutions of associated set-valued stochastic equations. Next we show that every solution to stochastic inclusion is a continuous selection of a multivalued solution of an associated set-valued stochastic equation. Additionally we establish other properties of such solutions. The results obtained in the paper extends results dealing with this topic known both in deterministic and stochastic cases.


1975 ◽  
Vol 12 (04) ◽  
pp. 824-830
Author(s):  
Arthur H. C. Chan

Let W (s, t), s, t ≧ 0, be the two-parameter Yeh–Wiener process defined on the first quadrant of the plane, that is, a Gaussian process with independent increments in both directions. In this paper, a lower bound for the distribution of the supremum of W (s, t) over a rectangular region [0, S]×[0, T], for S, T > 0, is given. An upper bound for the same was known earlier, while its exact distribution is still unknown.


1975 ◽  
Vol 12 (4) ◽  
pp. 824-830 ◽  
Author(s):  
Arthur H. C. Chan

Let W (s, t), s, t ≧ 0, be the two-parameter Yeh–Wiener process defined on the first quadrant of the plane, that is, a Gaussian process with independent increments in both directions. In this paper, a lower bound for the distribution of the supremum of W (s, t) over a rectangular region [0, S]×[0, T], for S, T > 0, is given. An upper bound for the same was known earlier, while its exact distribution is still unknown.


1973 ◽  
Vol 10 (04) ◽  
pp. 875-880 ◽  
Author(s):  
S. R. Paranjape ◽  
C. Park

Let D = [0, S] × [0, T] be a rectangle in E2 and X(s, t), (s, t)∈D, be a two parameter Yeh-Wiener process. This paper finds the probability distribution of the supremum of X(s, t) on the boundary of D by taking the limit of the probability distribution of the supremum of X(s, t) along certain paths as these paths approach the boundary of D. The probability distribution of the supremum of X(s, t) on the boundary of D gives a nice lower bound for the probability distribution of the supremum of X(s, t) on D, which is unknown.


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