Determination of thin metal film thickness by x-ray diffractometry using the Scherrer equation, atomic absorption analysis and transmission/reflection visible spectroscopy
1992 ◽
Vol 262
(2)
◽
pp. 269-275
◽
Keyword(s):
Keyword(s):
1970 ◽
Vol 34
(2)
◽
pp. 382-386
◽
Keyword(s):