Determination of thin metal film thickness by x-ray diffractometry using the Scherrer equation, atomic absorption analysis and transmission/reflection visible spectroscopy

1992 ◽  
Vol 262 (2) ◽  
pp. 269-275 ◽  
Author(s):  
Alfred T. D'Agostino
2013 ◽  
Vol 536 ◽  
pp. 142-146 ◽  
Author(s):  
C. Camerlingo ◽  
M.P. Lisitskiy ◽  
L. De Stefano ◽  
I. Rea ◽  
I. Delfino ◽  
...  

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