Angle dependence of the magnetoresistance in the mixed state of YBa2Cu3O7 and Y0.8Pr0.2Ba2Cu3O7 thin films

1994 ◽  
Vol 235-240 ◽  
pp. 3133-3134
Author(s):  
P. Tuset ◽  
M.G. Karkut ◽  
K. Fossheim
Keyword(s):  
Thin Films ◽  
Mixed State ◽  
Angle Dependence

The angle dependence of the upper critical field of HoNi2B2C thin films

2000 ◽  
Vol 341-348 ◽  
pp. 761-762 ◽  
Author(s):  
K. Haese ◽  
B. Holzapfel ◽  
L. Schultz
Keyword(s):  
Thin Films ◽  
Critical Field ◽  
Upper Critical Field ◽  
Angle Dependence

Dynamic mixed state of high Tcepitaxial thin films

1991 ◽  
Vol 4 (1S) ◽  
pp. S94-S96 ◽  
Author(s):  
V M Pan ◽  
V G Prokhorov ◽  
G G Kaminsky ◽  
A L Kasatkin ◽  
M A Kuznetsov ◽  
...  
Keyword(s):  
Thin Films ◽  
Mixed State

Near-Surface-Layer Analysis by Critical Takeoff-Angle X-Ray Fluorescence Detection

1992 ◽  
Vol 36 ◽  
pp. 257-262
Author(s):  
Shinjiro Hayakawa ◽  
Satoshi Sasaki ◽  
Yohichi Gohshi
Keyword(s):  
Thin Films ◽  
Surface Layer ◽  
Fluorescence Detection ◽  
Depth Profiling ◽  
Near Surface ◽  
X Ray ◽  
Angle Dependence ◽  
Layer Analysis ◽  
Takeoff Angle

AbstractNear-surface-layer analysis by x-ray fluorescence critical takeoff-angle detection was examined theoretically and experimentally. The takeoff-angle dependence of Cr K-L x-ray fluorescence from Cr thin films was measured with practical analyzed depth varying from several thousand to less than one hundred angstroms. Comparison of Cr K-L and K-M takeoff-angle dependence shows the analyzed depth depends on the observed x-ray energy even with identical takeoff angles. The potential of nondestructive depth profiling is also discussed.

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