scholarly journals The potential of Pléiades images with high angle of incidence for reconstructing the coastal cliff face in Normandy (France)

Author(s):  
Pauline Letortu ◽  
Marion Jaud ◽  
Claire Théry ◽  
Jean Nabucet ◽  
Roza Taouki ◽  
...  

A cylindrical specimen chamber and camera have been used to study the high-angle Kikuchi patterns obtained by reflexion of electrons, of energy 6 to 50 keV, from the cleavage surfaces of crystals with the sodium chloride structure. Angles of scattering ranging from 0 to 164° were covered. The relative intensity of the pattern at different scattering angles was measured using a photographic technique. The intensity distribution was found to become less steep as the energy of the incident electrons decreased. In photographs taken with a large value of the glancing angle of incidence, defect bands were found, starting near the shadow edge of the pattern; these changed to excess bands at higher angles of scattering. The most striking feature of the results is the remarkable intensity and clarity at the highest scattering angles of the pattern produced by crystals such as lead sulphide and potassium iodide, the constituents of which have a relatively high elastic scattering cross-section. In marked contrast, a relatively low intensity and low clarity was found at these angles for lithium fluoride under the same experimental conditions. An investigation of the width of Kikuchi bands, visible over the whole available angular range, showed that the electrons forming these bands had the same energy as that of the incident electrons within the experimental error of 10%. A possible mechanism is discussed by means of which electrons can be diffused through large angles with high efficiency, relative to small angles, and with relatively little loss of energy.


2012 ◽  
Vol 49 (3) ◽  
pp. 496-506 ◽  
Author(s):  
Michael Atkinson ◽  
Jonathan Poggie ◽  
José Camberos

2019 ◽  
Author(s):  
Yuchen Leng ◽  
Heesik Yoo ◽  
Thierry Jardin ◽  
Murat Bronz ◽  
Jean-Marc Moschetta

1988 ◽  
Vol 42 (7) ◽  
pp. 1296-1302 ◽  
Author(s):  
Yuichi Ishino ◽  
Hatsuo Ishida

The most sensitive reflection spectroscopic technique has been developed for studying the structure of thin films between a semiconductor and a metallic film. In this study, a metal-overlayer ATR technique was applied to measure the infrared spectra of interfacial layers. According to optical theory, this technique requires a high angle of incidence near the grazing angle in order to obtain optimum sensitivity. On the basis of the theoretical prediction, an optimized prism was designed. Our prism/thin film/ metal configuration yields an S/N ratio 5 times better than that achieved by the conventional reflection-absorption spectroscopy. This enhancement is not due to the so-called metal island effect, but is due instead to the high refractive index of the semiconductor prism.


Author(s):  
Yuchen Leng ◽  
Thierry Jardin ◽  
Murat Bronz ◽  
Jean-Marc Moschetta

Author(s):  
Yuchen Leng ◽  
Heesik Yoo ◽  
Thierry Jardin ◽  
Murat Bronz ◽  
Jean-Marc Moschetta

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