Automatic correction of artifact from single-trial event-related potentials by blind source separation using second order statistics only

2006 ◽  
Vol 28 (8) ◽  
pp. 780-794 ◽  
Author(s):  
K.H. Ting ◽  
P.C.W. Fung ◽  
C.Q. Chang ◽  
F.H.Y. Chan
2019 ◽  
Vol 155 ◽  
pp. 63-72 ◽  
Author(s):  
Denis G. Fantinato ◽  
Leonardo T. Duarte ◽  
Yannick Deville ◽  
Romis Attux ◽  
Christian Jutten ◽  
...  

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