Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits

2015 ◽  
Vol 55 (1) ◽  
pp. 238-250 ◽  
Author(s):  
Ghaith Bany Hamad ◽  
Syed Rafay Hasan ◽  
Otmane Ait Mohamed ◽  
Yvon Savaria
Keyword(s):  
Error Propagation ◽  
Digital Circuits ◽  
Soft Error

scholarly journals FAILURE TOLERANT SYNCHRONOUS AND SELT-TIED CIRCUITS COMPARISON

2021 ◽  
Author(s):  
Aleksandr Zatsarinny ◽  
Yuri Stepchenkov ◽  
Yuri Diachenko ◽  
Yuri Rogdestvenski
Keyword(s):  
Digital Circuits ◽  
Soft Error ◽  
Error Tolerance ◽  
Electronic Circuits ◽  
Two Phase ◽  
Synchronous Circuits ◽  
Tolerance Level ◽  
Failure Tolerance ◽  
Hardware Costs ◽  
Signal Coding

The article considers the problem of developing synchronous and self-timed (ST) digital circuits that are tolerant to soft errors. Synchronous circuits traditionally use the 2-of-3 voting principle to ensure single failure, resulting in three times the hardware costs. In ST circuits, due to dual-rail signal coding and two-phase control, even duplication provides a soft error tolerance level 2.1 to 3.5 times higher than the triple modular redundant synchronous counterpart. The development of new high-precision software simulating microelectronic failure mechanisms will provide more accurate estimates for the electronic circuits' failure tolerance

scholarly journals Soft Error Reliability Improvement of Digital Circuits by Exploiting a Fast Gate Sizing Scheme

IEEE Access ◽  
2019 ◽  
Vol 7 ◽  
pp. 66485-66495 ◽  
Author(s):  
Mohsen Raji ◽  
M. Amin Sabet ◽  
Behnam Ghavami
Keyword(s):  
Digital Circuits ◽  
Soft Error ◽  
Gate Sizing ◽  
Reliability Improvement

Modeling Soft-Error Propagation in Programs

2018 ◽  
Author(s):  
Guanpeng Li ◽  
Karthik Pattabiraman ◽  
Siva Kumar Sastry Hari ◽  
Michael Sullivan ◽  
Timothy Tsai
Keyword(s):  
Error Propagation ◽  
Soft Error

Soft-error filtering: A solution to the reliability problem of future VLSI digital circuits

1986 ◽  
Vol 74 (5) ◽  
pp. 669-683 ◽  
Author(s):  
Y. Savaria ◽  
N.C. Rumin ◽  
J.F. Hayes ◽  
V.K. Agarwal
Keyword(s):  
Digital Circuits ◽  
Soft Error ◽  
Reliability Problem ◽  
Error Filtering
Sign in / Sign up

Export Citation Format

Share Document