Development of an electrostatic high-brightness slow positron beam apparatus for positron scattering experiments

2008 ◽  
Vol 266 (3) ◽  
pp. 416-418 ◽  
Author(s):  
Wataru Suda ◽  
Kazuaki Nagumo ◽  
Daiki Tomida ◽  
Masamitsu Hoshino ◽  
Yasuyuki Nagashima ◽  
...  
Keyword(s):  
Positron Beam ◽  
Positron Scattering ◽  
High Brightness ◽  
Slow Positron

scholarly journals An electrostatic slow positron beam apparatus for positron scattering experiments

2010 ◽  
Vol 199 ◽  
pp. 012024 ◽  
Author(s):  
Kazuaki Nagumo ◽  
Yuna Nitta ◽  
Daiki Tomida ◽  
Masamitsu Hoshino ◽  
Hiroshi Tanaka ◽  
...  
Keyword(s):  
Positron Beam ◽  
Positron Scattering ◽  
Slow Positron

scholarly journals Measurements of the total cross sections for positron-He scattering using an electrostatic high-brightness slow positron beam apparatus

2009 ◽  
Vol 194 (7) ◽  
pp. 072007
Author(s):  
Kazuaki Nagumo ◽  
Daiki Tomida ◽  
Yuna Nitta ◽  
Masamitsu Hoshino ◽  
Hiroshi Tanaka ◽  
...  
Keyword(s):  
Cross Sections ◽  
Positron Beam ◽  
High Brightness ◽  
Slow Positron ◽  
Total Cross Sections

Depth profiling of defects in nitrogen implanted silicon using a slow positron beam

1999 ◽  
Vol 149 (1-4) ◽  
pp. 175-180 ◽  
Author(s):  
J.W. Taylor ◽  
A.S. Saleh ◽  
P.C. Rice-Evans ◽  
A.P. Knights ◽  
C. Jeynes
Keyword(s):  
Depth Profiling ◽  
Positron Beam ◽  
Slow Positron

Vacancy defects in epitaxial La0.7Sr0.3MnO3thin films probed by a slow positron beam

2004 ◽  
Vol 37 (13) ◽  
pp. 1841-1844 ◽  
Author(s):  
S W Jin ◽  
X Y Zhou ◽  
W B Wu ◽  
C F Zhu ◽  
H M Weng ◽  
...  
Keyword(s):  
Positron Beam ◽  
Slow Positron ◽  
Vacancy Defects

Defect characterization of CdTe thin films using a slow positron beam

2007 ◽  
Vol 4 (10) ◽  
pp. 3659-3663 ◽  
Author(s):  
S. Neretina ◽  
D. Grebennikov ◽  
R. A. Hughes ◽  
M. Weber ◽  
K. G. Lynn ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Beam ◽  
Defect Characterization ◽  
Slow Positron ◽  
Cdte Thin Films
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