Aluminium oxide nanowires synthesis from high purity aluminium films via two-step anodization

2015 ◽  
Vol 81 ◽  
pp. 1-6 ◽  
Author(s):  
Azadeh Nazemi ◽  
Ahmad Najafian ◽  
Seyed Abolfazl Seyed Sadjadi
Keyword(s):  
High Purity ◽  
Aluminium Oxide ◽  
Oxide Nanowires ◽  
Purity Aluminium ◽  
High Purity Aluminium

scholarly journals Determination of trace impurities in high-purity aluminium oxide by acid pressure decomposition-ICP-AES.

1986 ◽  
Vol 35 (8) ◽  
pp. 636-640 ◽  
Author(s):  
Hisashi MORIKAWA ◽  
Yasuo IIDA ◽  
Toshio ISHIZUKA ◽  
Fumiaki YOKOTA
Keyword(s):  
High Purity ◽  
Aluminium Oxide ◽  
Trace Impurities ◽  
Purity Aluminium ◽  
High Purity Aluminium

scholarly journals Determination of trace impurities in high-purity aluminium oxide by spark source MS.

1986 ◽  
Vol 35 (8) ◽  
pp. 753-758 ◽  
Author(s):  
Masao SASAKI ◽  
Youichi UMADA ◽  
Hiromi WATANABE ◽  
Hiroshi UMEZAKI
Keyword(s):  
High Purity ◽  
Aluminium Oxide ◽  
Trace Impurities ◽  
Purity Aluminium ◽  
High Purity Aluminium

Shape rheocasting of high purity aluminium

2011 ◽  
Vol 64 (6) ◽  
pp. 479-482 ◽  
Author(s):  
U.A. Curle ◽  
H. Möller ◽  
J.D. Wilkins
Keyword(s):  
High Purity ◽  
Purity Aluminium ◽  
High Purity Aluminium

Recrystallization of high-purity aluminium during equal channel angular pressing

2007 ◽  
Vol 55 (7) ◽  
pp. 2211-2218 ◽  
Author(s):  
W. Skrotzki ◽  
N. Scheerbaum ◽  
C.-G. Oertel ◽  
H.-G. Brokmeier ◽  
S. Suwas ◽  
...  
Keyword(s):  
Equal Channel Angular Pressing ◽  
High Purity ◽  
Angular Pressing ◽  
Purity Aluminium ◽  
High Purity Aluminium

Further evidence for the presence of residual flaws in a thin oxide layer covering high purity aluminium

1993 ◽  
Vol 34 (12) ◽  
pp. 2099-2104 ◽  
Author(s):  
G.M. Brown ◽  
K. Shimizu ◽  
K. Kobayashi ◽  
G.E. Thompson ◽  
G.C. Wood
Keyword(s):  
Oxide Layer ◽  
High Purity ◽  
Thin Oxide Layer ◽  
Purity Aluminium ◽  
High Purity Aluminium ◽  
Thin Oxide

Structure Development during ECAP and Subsequent Creep of Aluminium

2007 ◽  
Vol 539-543 ◽  
pp. 493-498 ◽  
Author(s):  
Ivan Saxl ◽  
Vàclav Sklenička ◽  
L. Ilucová ◽  
Milan Svoboda ◽  
Petr Král
Keyword(s):  
High Purity ◽  
Grain Orientation ◽  
Orientation Imaging Microscopy ◽  
Structural Inhomogeneity ◽  
Structure Development ◽  
Creep Fracture ◽  
Orientation Imaging ◽  
Purity Aluminium ◽  
High Purity Aluminium ◽  
Creep Loading

Considerable structural inhomogeneity and anisotropy were found even after eight ECAP passes in high purity aluminium and the creep loading of ECAP material at 473K, 15MPa resulted in scattered fracture times ~ 20-60 hours. The structure revealed by orientation imaging microscopy with different disclination bounds was analysed by stereological methods. The effect of inhomogeneity and grain orientation on the creep fracture time was assessed.

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