Depth profile characterization of Zn–TiO2 nanocomposite films by pulsed radiofrequency glow discharge-optical emission spectrometry

Nanocomposite Films ◽

Emission Spectrometry ◽

Pulsed Radiofrequency ◽

Analytical performance of pulsed radiofrequency glow discharge optical emission spectrometry for bulk and in-depth profile analysis of conductors and insulators

10.1039/c0ja00094a ◽

2011 ◽

Vol 26 (4) ◽

pp. 776-783 ◽

Cited By ~ 10

Author(s):

Deborah Alberts ◽

Beatriz Fernández ◽

Rosario Pereiro ◽

Alfredo Sanz-Medel

Keyword(s):

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Optical Emission ◽

Analytical Performance ◽

Emission Spectrometry ◽

Pulsed Radiofrequency ◽

Depth Profile Analysis ◽

Quantitative depth profile analysis of metallic coatings by pulsed radiofrequency glow discharge optical emission spectrometry

Analytica Chimica Acta ◽

10.1016/j.aca.2010.10.039 ◽

2011 ◽

Vol 684 (1-2) ◽

pp. 47-53 ◽

Cited By ~ 11

Author(s):

Pascal Sánchez ◽

Beatriz Fernández ◽

Armando Menéndez ◽

Jaime Orejas ◽

Rosario Pereiro ◽

...

Keyword(s):

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Optical Emission ◽

Emission Spectrometry ◽

Pulsed Radiofrequency ◽

Metallic Coatings ◽

Depth Profile Analysis ◽

Pulsed radiofrequency glow discharge optical emission spectrometry for the direct characterisation of photovoltaic thin film silicon solar cells

10.1039/b923884k ◽

2010 ◽

Vol 25 (3) ◽

pp. 370 ◽

Cited By ~ 20

Author(s):

Pascal Sánchez ◽

Beatriz Fernández ◽

Armando Menéndez ◽

Rosario Pereiro ◽

Alfredo Sanz-Medel

Keyword(s):

Thin Film ◽

Solar Cells ◽

Glow Discharge ◽

Optical Emission ◽

Emission Spectrometry ◽

Silicon Solar Cells ◽

Pulsed Radiofrequency ◽

Thin Film Silicon ◽

Endogenous and exogenous hydrogen influence on amorphous silicon thin films analysis by pulsed radiofrequency glow discharge optical emission spectrometry

Analytica Chimica Acta ◽

10.1016/j.aca.2011.11.052 ◽

2012 ◽

Vol 714 ◽

pp. 1-7 ◽

Cited By ~ 6

Author(s):

Pascal Sánchez ◽

Deborah Alberts ◽

Beatriz Fernández ◽

Armando Menéndez ◽

Rosario Pereiro ◽

...

Keyword(s):

Thin Films ◽

Glow Discharge ◽

Amorphous Silicon ◽

Optical Emission ◽

Emission Spectrometry ◽

Pulsed Radiofrequency ◽

Silicon Thin Films ◽

In-depth profile analysis of filled alumina and titania nanostructured templates by radiofrequency glow discharge coupled to optical emission spectrometry

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-009-3327-2 ◽

2009 ◽

Vol 396 (8) ◽

pp. 2833-2840 ◽

Cited By ~ 10

Author(s):

D. Alberts ◽

V. Vega ◽

R. Pereiro ◽

N. Bordel ◽

V. M. Prida ◽

...

Keyword(s):

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Optical Emission ◽

Emission Spectrometry ◽

Depth Profile Analysis ◽

In-depth profile analysis of oxide films by radiofrequency glow discharge optical emission spectrometry (rf-GD-OES): possibilities of depth-resolved solid-state speciation

10.1039/b803713b ◽

2008 ◽

Vol 23 (10) ◽

pp. 1378 ◽

Cited By ~ 10

Author(s):

Julien Malherbe ◽

Beatriz Fernández ◽

Hervé Martinez ◽

Patrick Chapon ◽

Peter Panjan ◽

...

Keyword(s):

Solid State ◽

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Oxide Films ◽

Optical Emission ◽

Emission Spectrometry ◽

Depth Profile Analysis ◽

In-depth profile analysis of thin films deposited on non-conducting glasses by radiofrequency glow-discharge–optical emission spectrometry

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-005-0123-5 ◽

2005 ◽

Vol 384 (4) ◽

pp. 876-886 ◽

Cited By ~ 9

Author(s):

Beatriz Fernández ◽

Antonio Martín ◽

Nerea Bordel ◽

Rosario Pereiro ◽

Alfredo Sanz-Medel

Keyword(s):

Thin Films ◽

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Optical Emission ◽

Emission Spectrometry ◽

Depth Profile Analysis ◽

Investigations on the Use of Radiofrequency Glow Discharge Optical Emission Spectrometry for In-depth Profile Analysis of Painted Coatings

10.1039/a701390f ◽

1997 ◽

Vol 12 (10) ◽

pp. 1209-1214 ◽

Cited By ~ 13

Author(s):

Matilde Fernández ◽

Nerea Bordel ◽

Rosario Pereiro ◽

Alfredo Sanz-medel

Keyword(s):

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Optical Emission ◽

Emission Spectrometry ◽

Depth Profile Analysis ◽

In-depth profile analysis by radiofrequency glow discharge optical emission spectrometry using pressure as variable parameter

10.1039/b010059p ◽

2001 ◽

Vol 16 (4) ◽

pp. 370-375 ◽

Cited By ~ 13

Author(s):

Jorge Pisonero ◽

Covadonga Pérez ◽

Rosario Pereiro ◽

Nerea Bordel ◽

Alfredo Sanz-Medel

Keyword(s):

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Variable Parameter ◽

Optical Emission ◽

Emission Spectrometry ◽

Depth Profile Analysis ◽

Preliminary study of the role of discharge conditions on the in-depth analysis of conducting thin films by radiofrequency glow discharge optical emission spectrometry

10.1039/ja9951000671 ◽

1995 ◽

Vol 10 (9) ◽

pp. 671-676 ◽

Cited By ~ 8

Author(s):

Nerea Bordel-García ◽

Rosario Pereiro-García ◽

Matilde Fernández-García ◽

Alfredo Sanz-Medel ◽

Tina R. Harville ◽

...

Keyword(s):

Thin Films ◽

Glow Discharge ◽

Optical Emission ◽

Emission Spectrometry ◽

Depth Analysis ◽

Preliminary Study ◽