Mapping defects in a carbon nanotube by momentum transfer dependent electron energy loss spectromicroscopy

2012 ◽  
Vol 113 ◽  
pp. 158-164 ◽  
Author(s):  
Ebrahim Najafi ◽  
Adam P. Hitchcock ◽  
David Rossouw ◽  
Gianluigi A. Botton
2004 ◽  
Vol 10 (S02) ◽  
pp. 844-845
Author(s):  
Ash Seepujak ◽  
Uschi Bangert ◽  
Aurora Gutierrez-Sosa ◽  
Alan J Harvey ◽  
V D Blank ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


2004 ◽  
Vol 10 (S02) ◽  
pp. 868-869
Author(s):  
Ash Seepujak ◽  
Uschi Bangert ◽  
Aurora Gutierrez-Sosa ◽  
Alan J Harvey ◽  
Adam J Papworth ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


2002 ◽  
Vol 738 ◽  
Author(s):  
K. Dovidenko ◽  
N. L. Abramson ◽  
J. Rullan

ABSTRACTIn this study, we have demonstrated successful site-specific cross-sectioning of carbon-nanotube - metal junctions which provided samples suitable for high resolution transmission electron microscopy and electron energy loss spectroscopy. For the cross-sectioning, we have suggested a modified technique based on combination of the Focused Ion Beam (FIB) lift-out and the conventional Ar+ ion milling techniques. Electron-transparent cross-sections of multiwall carbon nanotubes showing no significant surface amorphization or Ga contamination (typical artifacts of conventional FIB lift-out technique) were obtained. High-resolution transmission electron microscopy and electron energy loss spectroscopy of a multi-wall carbon nanotube cross-section have been carried out.


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