Characterization of Ga0.52In0.48P/GaAs single quantum well structures grown by solid source molecular beam epitaxy using deep level transient spectroscopy
2000 ◽
Vol 212
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pp. 49-55
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2014 ◽
Vol 29
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pp. 035002
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1996 ◽
Vol 11
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pp. 1185-1188
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2004 ◽
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pp. 897-901
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2000 ◽
Vol 209
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pp. 653-660
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