Characterization of Cd1−xMnxTe crystals grown by the Bridgman method and the zone melt method

2000 ◽  
Vol 214-215 ◽  
pp. 885-888 ◽  
Author(s):  
H Sato ◽  
K Onodera ◽  
H Ohba
Keyword(s):  
2021 ◽  
pp. 126303
Author(s):  
Masaru Nakamura ◽  
Hiroaki Nakamura ◽  
Kiyoshi Shimamura ◽  
Naoki Ohashi

2008 ◽  
Vol 43 (5) ◽  
pp. 1239-1245 ◽  
Author(s):  
Jijun Zhang ◽  
Wanqi Jie ◽  
Tao Wang ◽  
Dongmei Zeng ◽  
Shuying Ma ◽  
...  

2012 ◽  
Vol 535-537 ◽  
pp. 1446-1449
Author(s):  
Gao Li Wei ◽  
Lin Jun Wang ◽  
Ji Jun Zhang ◽  
Zheng Wen Yuan ◽  
Kai Feng Qin ◽  
...  

CdZnTe (CZT) crystals with a diameter of 52 mm was grown using low pressure Bridgman method and were indium-doped under Te-rich conditions. Results showed the Te concentration was almost the same in different part of the as-grown ingot. Through IR transmission, Te inclusion with regular triangular or circular shapes could be observed, and the size of Te inclusion was around 7 µm and the concentration was 1.5  105 cm-3 for the CZT in the middle part of the ingot. I-V characteristic showed a good linear behavior with a resistivity of ~1010 Ω•cm.


2011 ◽  
Vol 314 (1) ◽  
pp. 349-352 ◽  
Author(s):  
Zhiyu He ◽  
Beijun Zhao ◽  
Shifu Zhu ◽  
Jiawei Li ◽  
Yi Zhang ◽  
...  

2020 ◽  
Vol 31 (13) ◽  
pp. 10207-10212
Author(s):  
Pengfei Yu ◽  
Biru Jiang ◽  
Yongren Chen ◽  
Hanyue Lu ◽  
Yongwu Qi ◽  
...  

2016 ◽  
Vol 55 (12) ◽  
pp. 1202BF ◽  
Author(s):  
Etsuko Ohba ◽  
Takumi Kobayashi ◽  
Motohisa Kado ◽  
Keigo Hoshikawa

2007 ◽  
Vol 305 (1) ◽  
pp. 104-108 ◽  
Author(s):  
Zewen Wang ◽  
Wanqi Jie ◽  
Yong Xie ◽  
Haoliang Wang

1997 ◽  
Vol 171 (1-2) ◽  
pp. 125-130 ◽  
Author(s):  
A.A. Coelho ◽  
S. Gama ◽  
C.A. Ribeiro ◽  
N.L. Sanjurjo ◽  
Ch.V. Mohan ◽  
...  

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