Epitaxial orientation and a growth model of (00·1) GaN thin film on (111) spinel substrate

1998 ◽  
Vol 189-190 ◽  
pp. 202-207 ◽  
Author(s):  
Hitoshi Ohsato ◽  
Tomohisa Kato ◽  
Shihoko Koketsu ◽  
Rajesh Dayal Saxena ◽  
Takashi Okuda
Keyword(s):  
2020 ◽  
Vol 54 (3) ◽  
pp. 727-750 ◽  
Author(s):  
Wenbin Chen ◽  
Weijia Li ◽  
Zhiwen Luo ◽  
Cheng Wang ◽  
Xiaoming Wang

In this paper, a stabilized second order in time accurate linear exponential time differencing (ETD) scheme for the no-slope-selection thin film growth model is presented. An artificial stabilizing term $ A{\tau }^2\frac{\mathrm{\partial }{\Delta }^2u}{\mathrm{\partial }t}$ is added to the physical model to achieve energy stability, with ETD-based multi-step approximations and Fourier collocation spectral method applied in the time integral and spatial discretization of the evolution equation, respectively. Long time energy stability and detailed 𝓁∞(0,T;𝓁2) error analysis are provided based on the energy method, with a careful estimate of the aliasing error. In addition, numerical experiments are presented to demonstrate the energy decay and convergence rate.


Author(s):  
Guogen Liu ◽  
Zimeng Cheng ◽  
George E. Georgiou ◽  
Ken K. Chin

2000 ◽  
Vol 648 ◽  
Author(s):  
Jason T. Drotar ◽  
Y.-P. Zhao ◽  
T.-M. Lu ◽  
G.-C. Wang

AbstractThe Kardar-Parisi-Zhang (KPZ) surface roughening model was proposed nearly fifteen years ago. Although there have been many theoretical studies, there are very few experimental examples of thin film evolution obeying the KPZ equation. We discuss the physical basis of the KPZ equation and suggest possible reasons for the departure from KPZ behavior that is usually observed in surface growth/etching processes. Particularly, we construct a non-local, KPZ-like growth model that takes into account the effect of surface re-emission and show that, for certain limits, our model reduces to the KPZ model. We also discuss various experimental results in the context of known roughening models, including our model.


2009 ◽  
Vol 93 (1) ◽  
pp. 15-18 ◽  
Author(s):  
Jose Luis Cruz-Campa ◽  
David Zubia

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