Thickness measurement of dielectric films by wavelength scanning method

2002 ◽  
Vol 205 (1-3) ◽  
pp. 1-6 ◽  
Author(s):  
Oğuz Köysal ◽  
Duygu Önal ◽  
Serhat Özder ◽  
F. Necati Ecevit
Keyword(s):  
Thickness Measurement ◽  
Dielectric Films ◽  
Scanning Method ◽  
Wavelength Scanning

scholarly journals Surface and thickness measurement of a transparent film using wavelength scanning interferometry

2012 ◽  
Vol 20 (19) ◽  
pp. 21450 ◽  
Author(s):  
Feng Gao ◽  
Hussam Muhamedsalih ◽  
Xiangqian Jiang
Keyword(s):  
Thickness Measurement ◽  
Transparent Film ◽  
Wavelength Scanning

Thickness measurement of thin transparent plates with a broadband wavelength-scanning interferometer

2004 ◽  
Author(s):  
Pasquale Maddaloni ◽  
Giuseppe Coppola ◽  
Paolo de Natale ◽  
Sergio de Nicola ◽  
Pietro Ferraro ◽  
...  
Keyword(s):  
Thickness Measurement ◽  
Wavelength Scanning ◽  
Scanning Interferometer

Non - destructive method for thickness measurement of dielectric films using metamaterial resonator

2019 ◽  
Author(s):  
Anju Sebastian ◽  
Denet Davis ◽  
Sikha K. Simon ◽  
Sreedevi P. Chakyar ◽  
Jovia Jose ◽  
...  
Keyword(s):  
Thickness Measurement ◽  
Dielectric Films ◽  
Non Destructive

Thickness Measurement of Thin Transparent Plates With a Broad-Band Wavelength Scanning Interferometer

2004 ◽  
Vol 16 (5) ◽  
pp. 1349-1351 ◽  
Author(s):  
P. Maddaloni ◽  
G. Coppola ◽  
P. De Natale ◽  
S. De Nicola ◽  
P. Ferraro ◽  
...  
Keyword(s):  
Broad Band ◽  
Thickness Measurement ◽  
Wavelength Scanning ◽  
Scanning Interferometer
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