Systematic Root Cause Analysis of Adverse Drug Events in a Tertiary Referral Hospital

2000 ◽  
Vol 26 (10) ◽  
pp. 563-575 ◽  
Author(s):  
John H. Rex ◽  
Joanne E. Turnbull ◽  
Steven J. Allen ◽  
Kathryn Vande Voorde ◽  
Katharine Luther
Keyword(s):  
Adverse Drug Events ◽  
Root Cause Analysis ◽  
Referral Hospital ◽  
Tertiary Referral ◽  
Tertiary Referral Hospital ◽  
Cause Analysis ◽  
Root Cause

Root Cause Analysis of Ambulatory Adverse Drug Events That Present to the Emergency Department

2016 ◽  
Vol 12 (3) ◽  
pp. 119-124 ◽  
Author(s):  
Sarah A. Gertler ◽  
Zlatan Coralic ◽  
Andrea López ◽  
John C. Stein ◽  
Urmimala Sarkar
Keyword(s):  
Emergency Department ◽  
Adverse Drug Events ◽  
Root Cause Analysis ◽  
Cause Analysis ◽  
Root Cause

Root Cause analysis of SG tube ODSCC indications within the tube sheets of NPP biblis unit A

2011 ◽  
pp. 78-86
Author(s):  
R. Kilian ◽  
J. Beck ◽  
H. Lang ◽  
V. Schneider ◽  
T. Schönherr ◽  
...  
Keyword(s):  
Root Cause Analysis ◽  
Cause Analysis ◽  
Root Cause

Rule Construction and its Execution for Root Cause Analysis

2012 ◽  
Vol 132 (10) ◽  
pp. 1689-1697
Author(s):  
Yutaka Kudo ◽  
Tomohiro Morimura ◽  
Kiminori Sugauchi ◽  
Tetsuya Masuishi ◽  
Norihisa Komoda
Keyword(s):  
Root Cause Analysis ◽  
Cause Analysis ◽  
Root Cause

Root Cause Analysis Techniques Using Picosecond Time Resolved LADA

2014 ◽  
Author(s):  
Dan Bodoh ◽  
Kent Erington ◽  
Kris Dickson ◽  
George Lange ◽  
Carey Wu ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Picosecond Laser ◽  
Root Cause Analysis ◽  
Fault Isolation ◽  
Time Resolved ◽  
Cause Analysis ◽  
Root Cause ◽  
Design And Manufacturing ◽  
Multiple Interactions ◽  
Established Technique

Abstract Laser-assisted device alteration (LADA) is an established technique used to identify critical speed paths in integrated circuits. LADA can reveal the physical location of a speed path, but not the timing of the speed path. This paper describes the root cause analysis benefits of 1064nm time resolved LADA (TR-LADA) with a picosecond laser. It shows several examples of how picosecond TR-LADA has complemented the existing fault isolation toolset and has allowed for quicker resolution of design and manufacturing issues. The paper explains how TR-LADA increases the LADA localization resolution by eliminating the well interaction, provides the timing of the event detected by LADA, indicates the propagation direction of the critical signals detected by LADA, allows the analyst to infer the logic values of the critical signals, and separates multiple interactions occurring at the same site for better understanding of the critical signals.

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