Voltage dependence of the electron diffraction amplitudes in the ab initio analysis of copper perchlorophthalocyanine
Copper perchlorophthalocyanine has become a model compound for exploring the application of electron microscopic and diffraction methods in high resolution molecular structure research. Because of the scattering contrast between the Cu and Cl heavy atoms and the lighter C and N atoms, it was not possible to determine the structure with electron diffraction data obtained at 100 kV a number of years ago. Dynamical scattering all but obscures the detail in the diffraction data due to the unit cell Fourier transform. Studies at 500 kV had also determined that the electron microscopic images were influenced by dynamic scattering. Since our HVEM can be operated from 100 kV to 1.2 MV in 100 kV steps, we are studying the influence of accelerating voltage on our ability to determine atomic-level molecular structure.We recorded electron diffraction patterns from crystals epitaxially oriented on KCl and tilted 26.5° relative to the beam in order to align the c-axis of the unit cell along the beam direction.