Electron energy loss spectroscopy of diamond-like carbon thin films

Author(s):  
J. Kulik ◽  
Y. Lifshitz ◽  
G.D. Lempert ◽  
S. Rotter ◽  
J.W. Rabalais ◽  
...  

Carbon thin films with diamond-like properties have generated significant interest in condensed matter science in recent years. Their extreme hardness combined with insulating electronic characteristics and high thermal conductivity make them attractive for a variety of uses including abrasion resistant coatings and applications in electronic devices. Understanding the growth and structure of such films is therefore of technological interest as well as a goal of basic physics and chemistry research. Recent investigations have demonstrated the usefulness of energetic ion beam deposition in the preparation of such films. We have begun an electron microscopy investigation into the microstructure and electron energy loss spectra of diamond like carbon thin films prepared by energetic ion beam deposition.The carbon films were deposited using the MEIRA ion beam facility at the Soreq Nuclear Research Center in Yavne, Israel. Mass selected C+ beams in the range 50 to 300 eV were directed onto Si {100} which had been etched with HF prior to deposition.

2011 ◽  
Vol 20 (4) ◽  
pp. 538-541 ◽  
Author(s):  
Y. Tang ◽  
Y.S. Li ◽  
C.Z. Zhang ◽  
J. Wang ◽  
Q. Yang ◽  
...  

1999 ◽  
Vol 5 (S2) ◽  
pp. 632-633
Author(s):  
A.J. Papworth ◽  
C.J. Kiely ◽  
S.R.P. Silva ◽  
G.A.J. Amaratunga

Electron energy loss spectroscopy is the only direct technique that can semi-quantitatively determine the nature of the bonding in carbon thin films. To quantify the sp2/sp3 bonding fraction, the spectrum taken from the film must be compared to that of a suitable known standard. The bonding fraction can be analysed by studying the K ionisation edge in the electron energy loss spectrum. A method for quantifying the sp2 bonding fraction in an amorphous carbon film has been described by Berger et al (1988), where the area of peak of the film is compared with that of graphite. The principle of quantifying the edge structure is to obtain a ratio of the two peak areas using the following formula, (1), where fπis the ratio between the two π* peaks, Iπ. is the integral of the transition, and ΔE is the integrated counts for the normalising energy window. The superscripts s and u denote the standard and unknown spectra respectively.


2000 ◽  
Vol 62 (19) ◽  
pp. 12628-12631 ◽  
Author(s):  
A. J. Papworth ◽  
C. J. Kiely ◽  
A. P. Burden ◽  
S. R. P. Silva ◽  
G. A. J. Amaratunga

2003 ◽  
Vol 51 (17) ◽  
pp. 5211-5222 ◽  
Author(s):  
Sulin Zhang ◽  
Harley T. Johnson ◽  
Gregory J. Wagner ◽  
Wing Kam Liu ◽  
K.Jimmy Hsia

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