Rapid Determination of Water in Silicate Rocks

1955 ◽  
Vol 27 (4) ◽  
pp. 560-562 ◽  
Author(s):  
Leonard Shapiro ◽  
W. W. Brannock
Keyword(s):  
Rapid Determination ◽  
Silicate Rocks

Rapid Determination of Carbon Dioxide in Silicate Rocks

1955 ◽  
Vol 27 (11) ◽  
pp. 1796-1797 ◽  
Author(s):  
Leonard Shapiro ◽  
W. W. Brannock
Keyword(s):  
Carbon Dioxide ◽  
Rapid Determination ◽  
Silicate Rocks

scholarly journals Alkali fusion/ICP-MS for rapid determination of trace elements in silicate rocks.

1990 ◽  
Vol 39 (12) ◽  
pp. T169-T174 ◽  
Author(s):  
Tadashi MOCHIZUKI ◽  
Akiko SAKASHITA ◽  
Yoichi ISHIBASHI ◽  
Naoki GUNJI ◽  
Hideo IWATA
Keyword(s):  
Trace Elements ◽  
Rapid Determination ◽  
Alkali Fusion ◽  
Icp Ms ◽  
Silicate Rocks

A Flux-Free Fusion Technique for Rapid Determination of Major and Trace Elements in Silicate Rocks by LA-ICP-MS

2015 ◽  
Vol 40 (1) ◽  
pp. 5-21 ◽  
Author(s):  
Zhiwei He ◽  
Fang Huang ◽  
Huimin Yu ◽  
Yilin Xiao ◽  
Fangyue Wang ◽  
...  
Keyword(s):  
Trace Elements ◽  
Rapid Determination ◽  
Major And Trace Elements ◽  
Fusion Technique ◽  
Icp Ms ◽  
Silicate Rocks

Rapid determination of nanogram amounts of tellurium in silicate rocks

1976 ◽  
Vol 87 (2) ◽  
pp. 323-328 ◽  
Author(s):  
L.P. Greenland ◽  
E.Y. Campbell
Keyword(s):  
Rapid Determination ◽  
Silicate Rocks

Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

1976 ◽  
Vol 34 ◽  
pp. 590-591
Author(s):  
T. Y. Tan ◽  
W. K. Tice
Keyword(s):  
Fast Neutron ◽  
Rapid Determination ◽  
Stacking Faults ◽  
Imaging Method ◽  
Large Reduction ◽  
Dislocation Loops ◽  
Fringe Spacing ◽  
Weak Beam ◽  
Kinematical Theory

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.

Methods for rapid determination of pecan (Carya illinoensis) seed viability

2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu
Keyword(s):  
Rapid Determination ◽  
Seed Viability ◽  
Carya Illinoensis
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