Total Internal Reflection Peak Force Infrared Microscopy

2020 ◽  
Author(s):  
Haomin Wang ◽  
Le Wang ◽  
Eli Janzen ◽  
James H. Edgar ◽  
Xiaoji G. Xu
Keyword(s):  
Total Internal Reflection ◽  
Internal Reflection ◽  
Peak Force ◽  
Infrared Microscopy ◽  
Reflection Peak

Attenuated Total Internal Reflection Infrared Microscopy of Multilayer Plastic Packaging Foils

2007 ◽  
Vol 61 (6) ◽  
pp. 593-602 ◽  
Author(s):  
Gerard van Dalen ◽  
Patricia C. M. Heussen ◽  
Ruud Den Adel ◽  
Robert B. J. Hoeve
Keyword(s):  
Total Internal Reflection ◽  
Internal Reflection ◽  
Infrared Microscopy ◽  
Plastic Packaging ◽  
Attenuated Total Internal Reflection

Beam switching by nonlinear control of total internal reflection

1998 ◽  
Vol 45 (1) ◽  
pp. 179-192
Author(s):  
DAVID R. ROWLAND, WAGDY SAMIR, ROWLAND A.
Keyword(s):  
Nonlinear Control ◽  
Total Internal Reflection ◽  
Internal Reflection ◽  
Beam Switching

Comparison of sensitivity of the refractometric methods of frustrated total internal reflection and surface plasmon resonance

2020 ◽  
pp. 44-49
Author(s):  
I. N. Pavlov
Keyword(s):  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Total Internal Reflection ◽  
Resonance Method ◽  
Internal Reflection ◽  
Optical Methods ◽  
Thin Boundary Layer ◽  
Experimental Conditions ◽  
Frustrated Total Internal Reflection

Two optical methods, namely surface plasmon resonance imaging and frustrated total internal reflection, are described in the paper in terms of comparing their sensitivity to change of refractive index of a thin boundary layer of an investigated medium. It is shown that, despite the fact that the theoretically calculated sensitivity is higher for the frustrated total internal reflection method, and the fact that usually in practice the surface plasmon resonance method, on the contrary, is considered more sensitive, under the same experimental conditions both methods show a similar result.

Liquid-Phase Peak Force Infrared Microscopy

2020 ◽  
Author(s):  
Haomin Wang ◽  
Joseph M. González-Fialkowski ◽  
Wenqian Li ◽  
Yan Yu ◽  
Xiaoji Xu
Keyword(s):  
Liquid Phase ◽  
Spatial Resolution ◽  
Shear Force ◽  
Polymer Surface ◽  
Surface Damage ◽  
Peak Force ◽  
Infrared Microscopy ◽  
Contact Mode ◽  
Force Microscopy ◽  
Hydrogen Deuterium

Atomic force microscopy-infrared microscopy (AFM-IR) provides a route to bypass Abbe’s diffraction limit through photothermal detections of infrared absorption. With the combination of total internal reflection, AFM-IR can operate in the aqueous phase. However, AFM-IR in contact mode suffers from surface damage from the lateral shear force between the tip and sample, and can only achieve 20~25-nm spatial resolution. Here, we develop the liquid-phase peak force infrared (LiPFIR) microscopy that avoids the detrimental shear force and delivers an 8-nm spatial resolution. The non-destructiveness of the LiPFIR microscopy enables <i>in situ</i> chemical measurement of heterogeneous materials and investigations on a range of chemical and physical transformations, including polymer surface reorganization, hydrogen-deuterium isotope exchange, and ethanol-induced denaturation of proteins. We also perform LiPFIR imaging of the budding site of yeast cell wall in the fluid as a demonstration of biological applications. LiPFIR unleashes the potential of in liquid AFM-IR for chemical nanoscopy.

Achromatic Total Internal Reflection Prism in DLP Projection System

2019 ◽  
pp. 1279
Author(s):  
Ya-Chi Lu ◽  
Jhong-Syuan Li ◽  
Kao-Der Chang ◽  
Shie-Chang Jeng ◽  
Jui-Wen Pan
Keyword(s):  
Total Internal Reflection ◽  
Internal Reflection ◽  
Projection System

Achromatic Total Internal Reflection Prism in DLP Projection System

2019 ◽  
pp. 1279
Author(s):  
Ya-Chi Lu ◽  
Jhong-Syuan Li ◽  
Kao-Der Chang ◽  
Shie-Chang Jeng ◽  
Jui-Wen Pan
Keyword(s):  
Total Internal Reflection ◽  
Internal Reflection ◽  
Projection System
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