An electrostatic analyzer for surface structure measurements by low‐energy‐ion‐scattering

1995 ◽  
Vol 66 (5) ◽  
pp. 3273-3279 ◽  
Author(s):  
B. Hird ◽  
P. Gauthier ◽  
R. A. Armstrong
Keyword(s):  
Surface Structure ◽  
Low Energy ◽  
Ion Scattering ◽  
Electrostatic Analyzer ◽  
Low Energy Ion Scattering

Molecular surface structure of poly(3-hexylthiophene) studied by low energy ion scattering

2002 ◽  
Vol 512 (3) ◽  
pp. 194-200 ◽  
Author(s):  
M.W.G Ponjée ◽  
M.A Reijme ◽  
B.M.W Langeveld-Voss ◽  
A.W Denier van der Gon ◽  
H.H Brongersma
Keyword(s):  
Surface Structure ◽  
Low Energy ◽  
Molecular Surface ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

Comparison of a time-of-flight system with an electrostatic analyzer in low-energy ion scattering

1978 ◽  
Vol 149 (1-3) ◽  
pp. 591-594 ◽  
Author(s):  
T.M. Buck ◽  
G.H. Wheatley ◽  
G.L. Miller ◽  
D.A.H. Robinson ◽  
Y.-S. Chen
Keyword(s):  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Flight System ◽  
Electrostatic Analyzer ◽  
Low Energy Ion Scattering

Ag ADSORPTION ON THE W(100) PLANE

2003 ◽  
Vol 17 (29n30) ◽  
pp. 1527-1536
Author(s):  
D. S. CHOI ◽  
D. H. KIM ◽  
S. S. KIM
Keyword(s):  
Surface Structure ◽  
Adsorption Layer ◽  
Adsorption Site ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
Ion Scattering Spectroscopy

The surface structure of Ag/W(100) has been studied using LEED and Low Energy Ion Scattering Spectroscopy (ISS). We find that Ag coverages are saturated at 0.5 ML after annealing at 800°C regardless of the initial coverages between 0.7~1.0 ML. We observe a c(2×2) image after annealing the Ag/W(100) sample at 800°C. Using the ISS technique the adsorption site of Ag on the c(2×2) surface is found to be the center of the nearest two atoms on the W(100) surface. The height of the Ag adsorption layer is 1.58 Å above the W(100) surface.

Surface structure of epitaxial Nisi2 grown on Si(001) determined by low energy ion scattering techniques

1987 ◽  
Vol 186 (1-2) ◽  
pp. 115-137 ◽  
Author(s):  
Judy H. Huang ◽  
Richard S. Daley ◽  
David K. Shuh ◽  
R. Stanley Williams
Keyword(s):  
Surface Structure ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

Surface structure of epitaxial NiSi2 grown on Si(001) determined by low energy ion scattering techniques

1987 ◽  
Vol 186 (3) ◽  
pp. 280
Author(s):  
Judy H. Huang ◽  
Richard S. Daley ◽  
David K. Shuh ◽  
R.Stanley Williams
Keyword(s):  
Surface Structure ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

Ga-rich GaP(001)(2×4) surface structure studied by low-energy ion scattering spectroscopy

1998 ◽  
Vol 402-404 ◽  
pp. 623-627 ◽  
Author(s):  
M Naitoh ◽  
A Konishi ◽  
H Inenaga ◽  
S Nishigaki ◽  
N Oishi ◽  
...  
Keyword(s):  
Surface Structure ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
Ion Scattering Spectroscopy

Surface structure analysis using low energy ion scattering

1984 ◽  
Vol 141 (2-3) ◽  
pp. 549-566 ◽  
Author(s):  
L Marchut ◽  
T.M Buck ◽  
G.H Wheatley ◽  
C.J McMahon
Keyword(s):  
Surface Structure ◽  
Structure Analysis ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

New Surface Structure of Pd on Si(111) Studied by Low-Energy Ion-Scattering Spectroscopy and LEED-AES

1982 ◽  
Vol 21 (Part 2, No. 12) ◽  
pp. L752-L754 ◽  
Author(s):  
Yasufumi Yabuuchi ◽  
Fumiya Shoji ◽  
Kenjiro Oura ◽  
Teruo Hanawa ◽  
Yozo Kishikawa ◽  
...  
Keyword(s):  
Surface Structure ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
Ion Scattering Spectroscopy
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