Comparison of a time-of-flight system with an electrostatic analyzer in low-energy ion scattering

1978 ◽  
Vol 149 (1-3) ◽  
pp. 591-594 ◽  
Author(s):  
T.M. Buck ◽  
G.H. Wheatley ◽  
G.L. Miller ◽  
D.A.H. Robinson ◽  
Y.-S. Chen
Keyword(s):  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Flight System ◽  
Electrostatic Analyzer ◽  
Low Energy Ion Scattering

A combined time-of-flight and electrostatic analyzer for low-energy ion scattering

1999 ◽  
Vol 70 (10) ◽  
pp. 3910-3914 ◽  
Author(s):  
A. W. Denier van der Gon ◽  
M. A. Reijme ◽  
R. F. Rumphorst ◽  
A. J. H. Maas ◽  
H. H. Brongersma
Keyword(s):  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Electrostatic Analyzer ◽  
Low Energy Ion Scattering

Quantitative analysis of ultra thin layer growth by time-of-flight low energy ion scattering

2008 ◽  
Vol 92 (1) ◽  
pp. 011929 ◽  
Author(s):  
D. Primetzhofer ◽  
S. N. Markin ◽  
P. Zeppenfeld ◽  
P. Bauer ◽  
S. Prusa ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Thin Layer ◽  
Time Of Flight ◽  
Layer Growth ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

High resolution time-of-flight low energy ion scattering

2005 ◽  
Vol 230 (1-4) ◽  
pp. 398-401 ◽  
Author(s):  
M. Draxler ◽  
S.N. Markin ◽  
M. Kolíbal ◽  
S. Průša ◽  
T. Šikola ◽  
...  
Keyword(s):  
High Resolution ◽  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Resolution Time ◽  
Low Energy Ion Scattering

scholarly journals Analysis of Thin Films by Time-of-Flight Low Energy Ion Scattering

2007 ◽  
Vol 111 (3) ◽  
pp. 335-341
Author(s):  
S. Průša ◽  
M. Kolíbal ◽  
P. Bábor ◽  
J. Mach ◽  
T. Šikola
Keyword(s):  
Thin Films ◽  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

A comparison between time-of-flight and stripping cell methods used in low-energy ion scattering

1980 ◽  
Vol 13 (6) ◽  
pp. 665-672 ◽  
Author(s):  
S B Luitjens ◽  
A J Algra ◽  
E P Th M Suurmeijer ◽  
A L Boers
Keyword(s):  
Time Of Flight ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

The Atomic Fe/Ag Exchange on Ag(100)

1996 ◽  
Vol 441 ◽  
Author(s):  
M. H. Langelaar ◽  
D. O. Boerma
Keyword(s):  
Low Temperature ◽  
Low Temperatures ◽  
Time Of Flight ◽  
Low Energy ◽  
Simulation Program ◽  
Ion Scattering ◽  
Low Temperature Deposition ◽  
Low Energy Ion Scattering ◽  
Temperature Deposition ◽  
Site Exchange

AbstractIn this paper we present a low-energy ion scattering (LEIS) study of the site exchange of Fe adatoms with Ag atoms from the Ag(100) surface. The time-of-flight (TOF) spectra obtained at low temperatures have been interpreted with a newly developed LEIS simulation program MATCH. After low temperature deposition (˜50 K) of Fe atoms oil the Ag(100) surface, the Fe atoms occupy adatom positions. These Fe adatoms exchange sites with Ag atoms from the first layer, starting at a temperature of 130(10) K.

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