Electron‐beam‐induced current determination of minority‐carrier diffusion length and surface recombination velocity in mercury‐cadmium‐telluride

Journal of Applied Physics ◽

10.1063/1.335225 ◽

1985 ◽

Vol 57 (8) ◽

pp. 2886-2891 ◽

Author(s):

B. E. Artz

Keyword(s):

Mercury Cadmium Telluride ◽

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Induced Current ◽

Minority Carrier Diffusion Length ◽

Electron Beam Induced Current ◽

Recombination Velocity

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Quantification of the effects of generation volume, surface recombination velocity, and diffusion length on the electron‐beam‐induced current and its derivative: Determination of diffusion lengths in the low micron and submicron ranges

Journal of Applied Physics ◽

10.1063/1.334382 ◽

1985 ◽

Vol 57 (6) ◽

pp. 1978-1984 ◽

Author(s):

Keung L. Luke ◽

Oldwig von Roos ◽

Li‐jen Cheng

Keyword(s):

Electron Beam ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Induced Current ◽

Electron Beam Induced Current ◽

Recombination Velocity ◽

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Determination of minority‐carrier lifetime and surface recombination velocity by optical‐beam‐induced‐current measurements at different light wavelengths

Journal of Applied Physics ◽

10.1063/1.344161 ◽

1989 ◽

Vol 66 (7) ◽

pp. 3060-3065 ◽

Author(s):

Th. Flohr ◽

R. Helbig

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Optical Beam ◽

Surface Recombination Velocity ◽

Induced Current ◽

Recombination Velocity ◽

Optical Beam Induced Current

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Comment on ‘‘Evaluation of the minority carrier diffusion length and edge surface‐recombination velocity in GaAs p/n solar cells’’ [J. Appl. Phys. 72, 2919 (1992)]

Journal of Applied Physics ◽

10.1063/1.354502 ◽

1993 ◽

Vol 74 (5) ◽

pp. 3620-3621

Author(s):

Keung L. Luke

Keyword(s):

Solar Cells ◽

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Edge Surface ◽

Recombination Velocity

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Minority carrier diffusion length and edge surface-recombination velocity in InP

1993 (5th) International Conference on Indium Phosphide and Related Materials ◽

10.1109/iciprm.1993.380613 ◽

2002 ◽

Author(s):

R. Hakimzadeh ◽

S.G. Bailey

Keyword(s):

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Edge Surface ◽

Recombination Velocity

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Minority carrier diffusion length and edge surface‐recombination velocity in InP

Journal of Applied Physics ◽

10.1063/1.354936 ◽

1993 ◽

Vol 74 (2) ◽

pp. 1118-1123 ◽

Author(s):

Roshanak Hakimzadeh ◽

Sheila G. Bailey

Keyword(s):

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Edge Surface ◽

Recombination Velocity

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Evaluation of diffusion length and surface‐recombination velocity from a planar‐collector‐geometry electron‐beam‐induced current scan

Journal of Applied Physics ◽

10.1063/1.334400 ◽

1985 ◽

Vol 57 (6) ◽

pp. 2077-2090 ◽

Author(s):

H. K. Kuiken ◽

C. van Opdorp

Keyword(s):

Electron Beam ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Induced Current ◽

Electron Beam Induced Current ◽

Recombination Velocity

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Determination of the minority carrier diffusion length in compositionally graded Cu(In,Ga)Se2 solar cells using electron beam induced current

Applied Physics Letters ◽

10.1063/1.3291046 ◽

2010 ◽

Vol 96 (2) ◽

pp. 022104 ◽

Author(s):

Gregory Brown ◽

Vladimir Faifer ◽

Alex Pudov ◽

Sergey Anikeev ◽

Eugene Bykov ◽

...

Keyword(s):

Electron Beam ◽

Solar Cells ◽

Minority Carrier ◽

Diffusion Length ◽

Induced Current ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Electron Beam Induced Current

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Analysis of Electron Beam Induced Current Considering Sample Dimensions–Measurement of Diffusion Length and Surface Recombination Velocity–

Japanese Journal of Applied Physics ◽

10.1143/jjap.20.745 ◽

1981 ◽

Vol 20 (4) ◽

pp. 745-751 ◽

Author(s):

Takashi Fuyuki ◽

Hiroyuki Matsunami

Keyword(s):

Electron Beam ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Induced Current ◽

Electron Beam Induced Current ◽

Recombination Velocity

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Determination of surface recombination velocity at a grain boundary using electron‐beam‐induced current

Journal of Applied Physics ◽

10.1063/1.331726 ◽

1983 ◽

Vol 54 (1) ◽

pp. 169-173 ◽

Author(s):

D. E. Burk ◽

S. Kanner ◽

J. E. Muyshondt ◽

D. S. Shaulis ◽

P. E. Russell

Keyword(s):

Electron Beam ◽

Grain Boundary ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Induced Current ◽

Electron Beam Induced Current ◽

Recombination Velocity

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Determination of minority‐carrier diffusion length by integral properties of electron‐beam‐induced current profiles

Journal of Applied Physics ◽

10.1063/1.349454 ◽

1991 ◽

Vol 70 (4) ◽

pp. 2163-2168 ◽

Author(s):

D. Cavalcoli ◽

A. Cavallini ◽

A. Castaldini

Keyword(s):

Electron Beam ◽

Minority Carrier ◽

Diffusion Length ◽

Induced Current ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Electron Beam Induced Current

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