Micro Roughness Determination Of Periodic Microelectronics Structures Using Optical Far Field Measurements

2011 ◽  
Author(s):  
Alexandre Vauselle ◽  
Philippe Maillot ◽  
Gaëlle Georges ◽  
Carole Deumié ◽  
David G. Seiler ◽  
...  
Keyword(s):  
Field Measurements ◽  
Far Field

Determination of femtosecond-laser-induced refractive-index changes in an optical fiber from far-field measurements

2014 ◽  
Vol 39 (12) ◽  
pp. 3398 ◽  
Author(s):  
Juha-Matti Savolainen ◽  
Lars Grüner-Nielsen ◽  
Poul Kristensen ◽  
Peter Balling
Keyword(s):  
Refractive Index ◽  
Femtosecond Laser ◽  
Optical Fiber ◽  
Field Measurements ◽  
Far Field ◽  
Index Changes

scholarly journals The determination of boundary coefficients from far field measurements

2010 ◽  
Vol 22 (2) ◽  
pp. 167-191 ◽  
Author(s):  
Fioralba Cakoni ◽  
David Colton ◽  
Peter Monk
Keyword(s):  
Field Measurements ◽  
Far Field

Optical far field measurements applied to microroughness determination of periodic microelectronic structures

2011 ◽  
Author(s):  
Alexandre Vauselle ◽  
Philippe Maillot ◽  
Gaëlle Georges ◽  
Carole Deumié
Keyword(s):  
Field Measurements ◽  
Far Field
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