scholarly journals Stable Determination of the Surface Impedance of an Obstacle by Far Field Measurements

2006 ◽  
Vol 38 (2) ◽  
pp. 434-451 ◽  
Author(s):  
E. Sincich
Keyword(s):  
Surface Impedance ◽  
Field Measurements ◽  
Far Field

Micro Roughness Determination Of Periodic Microelectronics Structures Using Optical Far Field Measurements

2011 ◽  
Author(s):  
Alexandre Vauselle ◽  
Philippe Maillot ◽  
Gaëlle Georges ◽  
Carole Deumié ◽  
David G. Seiler ◽  
...  
Keyword(s):  
Field Measurements ◽  
Far Field

Determination of femtosecond-laser-induced refractive-index changes in an optical fiber from far-field measurements

2014 ◽  
Vol 39 (12) ◽  
pp. 3398 ◽  
Author(s):  
Juha-Matti Savolainen ◽  
Lars Grüner-Nielsen ◽  
Poul Kristensen ◽  
Peter Balling
Keyword(s):  
Refractive Index ◽  
Femtosecond Laser ◽  
Optical Fiber ◽  
Field Measurements ◽  
Far Field ◽  
Index Changes

scholarly journals The determination of boundary coefficients from far field measurements

2010 ◽  
Vol 22 (2) ◽  
pp. 167-191 ◽  
Author(s):  
Fioralba Cakoni ◽  
David Colton ◽  
Peter Monk
Keyword(s):  
Field Measurements ◽  
Far Field

scholarly journals The determination of the surface impedance of an obstacle

1993 ◽  
Vol 36 (1) ◽  
pp. 1-15 ◽  
Author(s):  
Andrzej W. Kȩdzierawski
Keyword(s):  
Acoustic Waves ◽  
Surface Impedance ◽  
Scattering Problem ◽  
Three Dimensional ◽  
Inverse Scattering Problem ◽  
Far Field ◽  
Field Patterns ◽  
Time Harmonic ◽  
Scattered Fields

The inverse scattering problem we consider is to determine the surface impedance of a three-dimensional obstacle of known shape from a knowledge of the far-field patterns of the scattered fields corresponding to many incident time-harmonic plane acoustic waves. We solve this problem by using both the methods of Kirsch-Kress and Colton-Monk.

Optical far field measurements applied to microroughness determination of periodic microelectronic structures

2011 ◽  
Author(s):  
Alexandre Vauselle ◽  
Philippe Maillot ◽  
Gaëlle Georges ◽  
Carole Deumié
Keyword(s):  
Field Measurements ◽  
Far Field
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