Run Length Distributions of Residual Control Charts for Autocorrelated Processes

1994 ◽  
Vol 26 (4) ◽  
pp. 308-317 ◽  
Author(s):  
Don G. Wardell ◽  
Herbert Moskowitz ◽  
Robert D. Plante
2008 ◽  
Vol 21 (1) ◽  
pp. 1-9 ◽  
Author(s):  
Amor Messaoud ◽  
Winfried Theis ◽  
Franz Hering ◽  
Claus Weihs

2009 ◽  
Vol 41 (4) ◽  
pp. 275-286 ◽  
Author(s):  
Giovanna Capizzi ◽  
Guido Masarotto

2010 ◽  
Vol 139-141 ◽  
pp. 1860-1863
Author(s):  
Qiu Xia Sun ◽  
Jian Li Zhao ◽  
Qi Sheng Gao

In this paper the average run length is adopted as the tool to describe the performance of control charts. The respective methods for calculating the average run length of the modified Shewhart control chart and the Shewhart residual control chart for 2-order autoregressive process are derived and shown in detail. By the proposed approach some numerical results of average run lengths of both Shewhart type charts are formulated and discussed. We analyze and compare that the influence of the correlation coefficients of the 2-order autoregressive process on the performance of both charts based on the estimated data. Several clear and main points of the issue are summed up. Lastly, we give some recommendations for the choice of both Shewhart type control schemes.


2004 ◽  
Vol 11 (1) ◽  
pp. 47-59
Author(s):  
Qidong Cao ◽  
J. Wayne Patterson ◽  
Xue Bai ◽  
Thomas E. Griffin

2017 ◽  
Vol 24 (3) ◽  
pp. 1603-1614 ◽  
Author(s):  
R. Osei-Aning ◽  
S.A. Abbasi ◽  
M. Riaz

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