Small area mean estimation after effect clustering

2019 ◽  
Vol 47 (4) ◽  
pp. 602-623
Author(s):  
Zhihuang Yang ◽  
Jiahua Chen
2017 ◽  
Vol 69 (2) ◽  
pp. 183-204 ◽  
Author(s):  
Julie Gershunskaya ◽  
Partha Lahiri

We propose a new robust empirical best estimation approach to estimate small area finite population means that are relatively insensitive to a model misspecification or to the presence of outliers. This important robustness property is achieved by replacing the standard normality assumption of the sampling errors in a nested-error regression (NER) model by a scale mixture of two normal distributions with different variances. We present a formal statistical test to identify if a small area is an outlier and provide an efficient new computing algorithm to implement our procedure. We examine the finite sample robustness properties of our proposed method using a Monte Carlo simulation and compare the proposed method with alternative existing methods in a study using data from the Current Employment Statistics (CES) survey conducted by the US Bureau of Labor Statistics (BLS).


Author(s):  
R. H. Geiss

The theory and practical limitations of micro area scanning transmission electron diffraction (MASTED) will be presented. It has been demonstrated that MASTED patterns of metallic thin films from areas as small as 30 Åin diameter may be obtained with the standard STEM unit available for the Philips 301 TEM. The key to the successful application of MASTED to very small area diffraction is the proper use of the electron optics of the STEM unit. First the objective lens current must be adjusted such that the image of the C2 aperture is quasi-stationary under the action of the rocking beam (obtained with 40-80-160 SEM settings of the P301). Second, the sample must be elevated to coincide with the C2 aperture image and its image also be quasi-stationary. This sample height adjustment must be entirely mechanical after the objective lens current has been fixed in the first step.


2001 ◽  
Vol 120 (5) ◽  
pp. A458-A458
Author(s):  
J BLANCHARD ◽  
A WAJDA ◽  
P RAWSTHORNE ◽  
C BERNSTEIN

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