Rapid determination of persulphate in aqueous solutions by visible spectrophotometry

Author(s):  
Lulu Wu ◽  
Huidi Yan ◽  
Naidong Zhang ◽  
Xiangpeng Kong
2007 ◽  
Vol 5 (4) ◽  
Author(s):  
Marie-Christine Fournier-Salaün ◽  
Philippe Salaün

AbstractIn the last decade, different methods have been developed for the determination of chromium(VI) concentration in water. These methods use high cost equipment or they require a long preparation time. Because of their drawbacks, this paper describes an on-line, rapid and sensitive procedure for the determination of Cr(VI) concentrations in aqueous solutions via pH and absorption measurements. Only four Cr(VI) species are considered. The effects of pH and of total amount of chromium on the Cr(VI) speciation are investigated. The molar absorptivities of four chromium species at 371 nm are determined by minimising an objective function. The knowledge of these molar absorptivities and the measurements of pH and absorption at 371 nm lead to a rapid determination of total Cr(VI) concentration. The reliability and applicability of the method were confirmed using synthetic water samples.


2018 ◽  
Vol 73 (3) ◽  
pp. 236-242 ◽  
Author(s):  
L. V. Zrelova ◽  
E. I. Belyaeva ◽  
D. Yu. Marchenko ◽  
E. A. Ivanova ◽  
D. A. Sandzhieva ◽  
...  

2008 ◽  
Vol 56 (9) ◽  
pp. 3167-3175 ◽  
Author(s):  
Ana M. Sánchez ◽  
Manuel Carmona ◽  
Amaya Zalacain ◽  
José M. Carot ◽  
José M. Jabaloyes ◽  
...  

Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu

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