Ion transport simulation in a low-pressure hydrogen gas at high electric fields by a convective-scheme method

1994 ◽  
Vol 27 (9) ◽  
pp. 1866-1873 ◽  
Author(s):  
J Bretagne ◽  
G Gousset ◽  
T Simko
Keyword(s):  
Ion Transport ◽  
Electric Fields ◽  
Low Pressure ◽  
Hydrogen Gas ◽  
Transport Simulation ◽  
High Electric Fields ◽  
Convective Scheme ◽  
Pressure Hydrogen

The influence of low-pressure hydrogen gas on crack growth in T.D.-nickel and T.D.-nichrome

1973 ◽  
Vol 7 (4) ◽  
pp. 409-414 ◽  
Author(s):  
J.D. Frandsen ◽  
N.E. Paton ◽  
H.L. Marcus
Keyword(s):  
Crack Growth ◽  
Low Pressure ◽  
Hydrogen Gas ◽  
Pressure Hydrogen

Ion Transport within High Electric Fields in Nanogap Electrochemical Cells

ACS Nano ◽  
2015 ◽  
Vol 9 (8) ◽  
pp. 8520-8529 ◽  
Author(s):  
Jiewen Xiong ◽  
Qianjin Chen ◽  
Martin A. Edwards ◽  
Henry S. White
Keyword(s):  
Ion Transport ◽  
Electric Fields ◽  
Electrochemical Cells ◽  
High Electric Fields

Atomic Spectroscopy in the FIM

1986 ◽  
Vol 44 ◽  
pp. 758-761
Author(s):  
J. J. Hren ◽  
S. D. Walck
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Atom Probe ◽  
Atomic Spectroscopy ◽  
Single Atom ◽  
Statistical Sampling ◽  
Commercial Instrument ◽  
Available Technology ◽  
High Electric Fields ◽  
Field Ion Microscope

The field ion microscope (FIM) has had the ability to routinely image the surface atoms of metals since Mueller perfected it in 1956. Since 1967, the TOF Atom Probe has had single atom sensitivity in conjunction with the FIM. “Why then hasn't the FIM enjoyed the success of the electron microscope?” The answer is closely related to the evolution of FIM/Atom Probe techniques and the available technology. This paper will review this evolution from Mueller's early discoveries, to the development of a viable commercial instrument. It will touch upon some important contributions of individuals and groups, but will not attempt to be all inclusive. Variations in instrumentation that define the class of problems for which the FIM/AP is uniquely suited and those for which it is not will be described. The influence of high electric fields inherent to the technique on the specimens studied will also be discussed. The specimen geometry as it relates to preparation, statistical sampling and compatibility with the TEM will be examined.

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