A TEM structural study of thermal stability of magnetic tunnel junctions integrated with CMOS devices
2008 ◽
Vol 126
◽
pp. 012002
◽
V K Lazarov
◽
A Kohn
◽
T Uhrmann
◽
T Dimopoulos
◽
H Brückl
◽
...
2005 ◽
Vol 290-291
◽
pp. 1146-1149
R. Kaltofen
◽
I. Mönch
◽
J. Schumann
◽
D. Elefant
◽
S. Zotova
◽
...
Chul-Min Choi
◽
Jin-Oh Song
◽
Seong-Rae Lee
2001 ◽
Vol 78
(2)
◽
pp. 234-236
◽
David J. Keavney
◽
Sungkyun Park
◽
Charles M. Falco
◽
J. M. Slaughter
N. Matsukawa
◽
A. Odagawa
◽
Y. Sugita
◽
Y. Kawashima
◽
Y. Morinaga
◽
...
2005 ◽
Vol 54
(11)
◽
pp. 5372
Feng Yu-Qing
◽
Zhao Kun
◽
Zhu Tao
◽
Zhan Wen-Shan
2002 ◽
Vol 199
(1-4)
◽
pp. 6-10
◽
H.D Jeong
◽
J.H Lee
◽
C.S Yoon
◽
C.K Kim
◽
J.H Yuh
2004 ◽
Vol 84
(2)
◽
pp. 233-235
◽
Yoshiyuki Fukumoto
◽
Ken-ichi Shimura
◽
Atsushi Kamijo
◽
Shuichi Tahara
◽
Hiroaki Yoda
2000 ◽
Vol 76
(21)
◽
pp. 3097-3099
◽
Mahesh G. Samant
◽
Jan Lüning
◽
Joachim Stöhr
◽
Stuart S. P. Parkin
2005 ◽
Vol 54
(9)
◽
pp. 4340
Feng Yu-Qing
◽
Hou Li-Na
◽
Zhu Tao
◽
Yao Shu-De
◽
Zhan Wen-Shan